CT Surface Analysis for Non-Planar Void Fraction Mapping

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing CT data analysis software is limited to analyzing planar slices of CMC components, failing to account for non-planar surfaces and interfaces that are critical for understanding mechanical and thermal properties.

Innovation Solution

A method and system for analyzing CT data that enables the alignment and projection of non-planar surfaces within CMC components, allowing for the quantification of void area fractions and other metrics on arbitrary surfaces using triangulation and interpolation techniques.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If commercial CT data analysis software is used, then planar slice analysis is enabled, but non-planar surface and interface analysis is not possible

Engineering Contradiction:
Improvesurface analysis capabilityVSAvoidvoid area fraction quantification accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent transitions from analyzing only planar 2D slices to analyzing arbitrary non-planar surfaces in 3D space. The system defines surfaces using multiple points that are not necessarily coplanar, enabling characterization of curved and complex interfaces that cannot be captured by traditional planar slicing methods.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent segments the CT data into distinct phases (e.g., matrix, voids, reinforcement) and then projects these segmented phases onto arbitrary non-planar surfaces. This segmentation approach allows independent analysis of different material phases on complex geometries.

Inventive Principle:
Principle #1Segmentation

2Reliability

If planar slice analysis is used, then analysis simplicity is maintained, but mechanical and thermal property prediction accuracy is reduced

Engineering Contradiction:
Improvespecimen behavior prediction accuracyVSAvoidanalysis method complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent moves from 2D planar analysis to 3D non-planar surface analysis, enabling accurate capture of interface geometries that control mechanical and thermal properties. The system calculates metrics such as void area fraction, phase distribution, and interface characteristics on arbitrary surfaces defined by multiple points in three-dimensional space.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent introduces an intermediary computational framework that bridges raw CT data and mechanical/thermal property predictions. This framework includes algorithms for defining arbitrary surfaces, projecting segmented phases onto these surfaces, and calculating relevant metrics that serve as inputs for property prediction models.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If arbitrary non-planar surface analysis is implemented, then accurate property characterization is achieved, but computational complexity increases

Engineering Contradiction:
Improvephase distribution measurement accuracyVSAvoiddata processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the three-dimensional CT data into distinct material phases before projecting onto non-planar surfaces. This pre-segmentation simplifies the subsequent projection and metric calculation steps by dealing with phase-specific data rather than raw volumetric data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates a computational representation (copy) of the arbitrary non-planar surface using coordinates of multiple points. This digital model of the surface enables repeated analysis without requiring physical access to the specimen and allows for efficient computation of various metrics on the same geometry.

Inventive Principle:
Principle #26Copying

Data Source

PatentEP4266032B1Method and apparatus for analyzing computer tomography data
Publication Date: 2026.02.11 RTX CORP
  • EP4266032B1 patent drawingFigure 1
  • EP4266032B1 patent drawingFigure 2
  • EP4266032B1 patent drawingFigure 3

AI summary

A method of analyzing computed tomography data according to an example embodiment of the present disclosure includes obtaining computed tomography (CT) data for a component, fitting an interpolant function to the CT data, and creating a mesh of a surface that extends through the component. The surface is arbitrary and non-planar. The method also includes querying the interpolant function at a plurality of points of the mesh to project the CT data onto the mesh, calculating a metric of the component based on the querying, and providing a notification of the metric. A system for computed tomography analysis is also disclosed. A method of analyzing computed tomography data for a component of a gas turbine engine that includes calculating a void area fraction is also disclosed.