Current Control Semiconductor Device Gain Offset Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current detection errors in IC chips arise due to variations in the gain and offset values caused by temperature changes and operational amplifier input offsets, leading to reduced precision in current measurement.
Innovation Solution
A current control semiconductor device with a transistor, current-voltage converter, and AD converter, featuring a reference current generation unit, gain/offset correction unit, and current digital value calculation unit that dynamically corrects gain and offset variations by superimposing a current pulse on the load and processing the resulting voltage digital values to acquire precise gain and offset values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the current detector circuit is incorporated into the IC chip, then the device size is reduced and price is lowered, but the gain and offset values vary significantly due to temperature and operational amplifier input offsets, causing current detection errors to increase
Solution Approach 1:
The patent applies preliminary action by performing gain and offset correction before actual current measurement. A correction current is superimposed on the load current, and the resulting voltage digital value variation is used to calculate correction values for gain and offset. This preliminary correction process compensates for temperature variations and operational amplifier input offsets before the actual measurement is performed, thereby maintaining high measurement precision in the integrated IC chip configuration
Solution Approach 2:
The patent utilizes parameter changes by dynamically adjusting the gain and offset parameters based on temperature and operational conditions. The correction unit calculates updated gain and offset values by measuring the voltage digital value variation caused by superimposed correction current, and applies these changed parameters to compensate for drift, thereby maintaining accurate current detection despite environmental variations
2Device complexity
If the gain and offset values are fixed according to design, then the circuit is simple, but the current detection precision deteriorates due to variations caused by temperature and operational amplifier input offsets
Solution Approach 1:
The patent implements feedback by continuously monitoring the voltage digital value output from the AD converter and using this information to adjust the gain and offset parameters. The correction unit receives the voltage digital value, calculates the actual gain and offset based on the superimposed correction current, and feeds back corrected parameters to the current detection circuit, thereby maintaining high precision without requiring overly complex hardware modifications
3Ease of manufacture
If a current detection resistor is incorporated into the IC chip, then external components are reduced, but the resistor value varies by tens of percent with temperature, causing gain variation
Solution Approach 1:
The patent compensates for resistor value variations by dynamically changing the gain parameter. The correction unit measures the actual voltage digital value variation caused by superimposed correction current, calculates the actual gain including temperature-induced resistor variations, and uses this changed gain parameter for accurate current detection, thereby offsetting the effects of temperature-varying resistor values
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables high-precision current detection within the IC chip by dynamically correcting gain and offset variations, thereby improving measurement accuracy and control precision.
Implementation Method 1
a current-voltage converter circuit that converts a current of the load into a voltage
Data Source
AI summary
A current control semiconductor device that can detect a current with high precision within an IC of one chip by dynamically correcting a variation in a gain a and an offset b, and a control device using the semiconductor device are provided. A transistor 4, a current-voltage converter circuit 22, and an AD converter 23 are disposed on an identical semiconductor chip. Reference current generator circuits 6 and 6′ superimpose a current pulse Ic on a current of a load 2, and vary a voltage digital value output by the AD converter. A gain/offset correction unit 8 subjects a variation in a voltage digital value caused by the reference current generator circuits 6, 6′ to signal processing, and dynamically acquires gains a, a′ and offsets b, b′ in a linear relational expression of the voltage digital value output by the AD converter 23 and a current digital value of the load. A current digital value calculation unit 12 corrects a voltage value output by the AD converter with the use of the gain and the offset acquired by the gain/offset correction unit 8.