Current-Controlled Semiconductor Device Gain Offset Correction
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Solution Overview
Problem
Current detection circuits integrated into IC chips experience significant fluctuations in gain and offset values due to temperature changes and reference voltage variations, leading to increased current detection errors in electromotive actuators.
Innovation Solution
A current-controlled semiconductor device with correction value calculating means that adjusts gain and offset values using temperature measurements and measured current values from constant current sources, allowing for accurate current detection within a single-chip IC by employing a microcontroller and memory elements to calculate and apply corrections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the current detection circuit is incorporated into the IC chip, then the size and cost of the control unit are reduced, but the gain a and offset b fluctuate greatly causing increased current detection error
Solution Approach 1:
The patent applies preliminary action by measuring the currents of constant current sources at different temperatures in advance, storing these measurement values in memory elements, and using them to calculate correction values for gain and offset before actual current detection. This allows the system to compensate for temperature-induced fluctuations without requiring external calibration during operation.
Solution Approach 2:
The patent implements feedback by using measured current values from constant current sources to calculate correction values that are then applied to correct the detected current values. The system continuously monitors temperature changes and adjusts gain and offset parameters based on stored reference measurements, creating a closed-loop compensation mechanism that maintains detection accuracy despite internal fluctuations.
2Device complexity
If the current detection circuit is incorporated into the IC chip, then the number of external parts is reduced, but temperature fluctuations cause significant changes in gain a and offset b
Solution Approach 1:
The patent applies self-service by enabling the current detection circuit to automatically compensate for its own temperature-induced errors using internal constant current sources and memory elements. The system measures reference currents at different temperatures, stores these characteristics, and uses them to self-correct detection errors without requiring external calibration equipment or additional stable reference components.
Solution Approach 2:
The patent implements parameter changes by dynamically adjusting the gain and offset parameters of the current detection circuit based on temperature conditions. The system stores measurement values obtained at different temperatures and selects or interpolates appropriate correction parameters according to the current temperature, allowing the circuit to adapt its characteristics to compensate for thermal drift.
3Measurement precision
If correction values are calculated using temperature measurements, then current detection accuracy is improved, but the device requires additional memory elements and processing
Solution Approach 1:
The patent reduces processing complexity during operation by performing the complex measurement and calculation work in advance. The system measures currents at different temperatures during manufacturing or initial setup, calculates correction values, and stores them in memory elements. During actual use, the system only needs to read stored values and apply simple corrections, significantly reducing real-time processing requirements.
Data Source
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AI summary
The present invention aims to provide a current-controlled semiconductor device (100) which corrects fluctuations of both gain and offset of a current detection circuit (120) to thereby enable high-accuracy current detection within a single-chip IC, and a control unit using the same. The current-controlled semiconductor device (100) is provided on the same semiconductor chip with a MOSFET (110H), two constant current sources (133,135), and a current detection circuit (120) which detects a current of the MOSFET and currents of the constant current sources. Further, the constant current sources are equipped with an external connecting terminal (T5) for measuring their current values. A correction measured-value holding register (145) holds therein the current values of the constant current sources, which have been measured from outside.