Current Distribution Device for Semiconductor Testing
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Solution Overview
Problem
Existing electronic devices for distributing electric current to multiple current paths, such as those used for testing semiconductor components or lighting technologies, face challenges in ensuring equal current distribution and protection against surge and over-voltage conditions.
Innovation Solution
The proposed solution involves an electronic device with a power source, electric circuits comprising low-resistance components for normal current ranges and high-resistance components above a given limit, along with DC/DC converter circuits and a control voltage source, which includes transistors and adjustable resistors to manage current distribution and protection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If additional devices or circuits are implemented to equally distribute electric current to multiple current paths, then current distribution equality is improved, but device complexity increases
Solution Approach 1:
The patent implements current distribution equality through self-service mechanisms where each current path includes a sense resistor and feedback circuit that automatically adjusts its own current based on detected deviations. The control unit compares sensed current values with reference values and autonomously regulates switching elements to maintain equal current distribution without requiring external intervention or complex centralized control.
Solution Approach 2:
The patent employs feedback mechanisms where current sense resistors detect actual current values in each path, and these detected values are fed back to control units. The control units process this feedback information and adjust switching elements accordingly to maintain equal current distribution. This closed-loop feedback system ensures precise current equality while using relatively simple control circuitry.
2Reliability
If additional devices or circuits are implemented to protect against surge and over-voltage conditions, then protection capability is improved, but device complexity increases
Solution Approach 1:
The patent implements protection against surge and over-voltage conditions through preliminary action by incorporating over-voltage detection circuits and protective switching elements that are activated before damage occurs. The control unit continuously monitors voltage levels and preemptively opens switching elements or activates protective circuits when threshold values are approached, preventing damage before it happens rather than responding after failure occurs.
Solution Approach 2:
The patent uses intermediary protective elements such as sense resistors, diodes, and switching elements that act as mediators between the power source and the load circuits. These intermediary components detect abnormal conditions and isolate affected parts of the circuit, protecting the overall system from surge and over-voltage damage while adding minimal complexity to the design.
3Measurement precision
If DC/DC converter circuits are used to manage current distribution, then current management precision is improved, but device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the current management function into separate DC/DC converter circuits for each current path or group of paths. Each converter circuit independently manages its assigned current paths with dedicated control units, sense resistors, and switching elements. This segmentation allows precise current management in each segment while keeping individual control circuits relatively simple compared to a single centralized control system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration ensures equal current distribution to multiple current paths while providing protection against high voltage and current surges, effectively supporting semiconductor component testing and other applications requiring precise current management.
Implementation Method 1
a first DC/DC converter circuit and a second DC/DC converter circuit, wherein the first DC/DC converter circuit is connected between the control voltage source and the second DC/DC converter circuit, and the second DC/DC converter circuit is connected between the first DC/DC converter circuit and the at least one electric circuit
Implementation Method 2
the electric circuit comprising at least one circuit component which has low resistance in a range of electric currents and has high resistance above a given limit electric current
Data Source
AI summary
An electronic device for testing of semiconductor components with test needles includes an electric power source, a plurality of test needles connected with the electric power source, a plurality of electric circuits, each one of the electric circuits connected upstream of one of the test needles, each one of the electric circuits including at least one circuit component which has low resistance in a range of electric currents and has high resistance above a given limit electric current, a control voltage source connected with each one of the electric circuits, and two DC/DC converter circuits connected between the control voltage source and the electric circuits.