Current Mirror for Semiconductor Device Test Systems
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Solution Overview
Problem
Current semiconductor device test systems lack an efficient method to create an environment where a device under test (DUT) can output a current for effective testing, relying on automatic test equipment (ATE) to provide power and measure voltage or current, but this approach may not fully assess the DUT's operational capabilities.
Innovation Solution
Incorporating a current mirror between the ATE and the DUT, where the ATE supplies a reference current to the current mirror, and the DUT provides an output current by mirroring this reference current, allowing the ATE to measure the output voltage and determine the DUT's operational status.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ATE directly measures current output from DUT, then measurement capability is limited, but adding current mirror increases system complexity
Solution Approach 1:
The patent introduces a current mirror as an intermediary component between the DUT and ATE. The current mirror converts the DUT's current output into a measurable voltage signal that the ATE can accurately measure, thereby enhancing current measurement capability without requiring the ATE to directly measure current. This resolves the contradiction by adding a mediating element that transforms the measurement task into a more capable domain.
2Adaptability or versatility
If ATE provides power and measures voltage only, then testing capability is insufficient, but modifying test methodology increases procedure complexity
Solution Approach 1:
The patent employs a current mirror that creates a copied version of the DUT's output current as a voltage signal. Instead of directly measuring the current, the system creates an electrical copy (voltage equivalent) that can be measured by the existing ATE voltage measurement capability. This allows the system to assess DUT current output capability using existing measurement infrastructure, enhancing versatility without proportionally increasing procedure complexity.
3Reliability
If conventional ATE configuration is used, then setup is simple, but comprehensive DUT evaluation cannot be achieved
Solution Approach 1:
The patent segments the measurement function by separating current measurement from voltage measurement. The current mirror handles the current-to-voltage conversion function, while the ATE handles the voltage measurement function. This segmentation allows each component to perform its specialized function efficiently, achieving comprehensive DUT evaluation (both current and voltage characteristics) while maintaining a modular system architecture that doesn't overly complicate the overall configuration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables the ATE to accurately assess the DUT's output current and voltage, providing a comprehensive evaluation of the DUT's operational characteristics and determining whether it has passed the test by measuring the output voltage based on the mirrored current.
Implementation Method 1
a current mirror which is connected between the ATE and the DUT, wherein the ATE outputs a reference current to the current mirror, and the DUT provides an output current to the current mirror, the output current being obtained by mirroring the reference current from the ATE to the current mirror
Data Source
AI summary
A semiconductor device test system and a semiconductor device test method are provided. The system includes a device under test (DUT) which provides an output voltage to a load connected to an output terminal, automatic test equipment (ATE) which supplies power to the DUT and measures the output voltage of the DUT, and a current mirror which is connected between the ATE and the DUT. The ATE outputs a reference current to the current mirror, and the DUT provides an output current to the current mirror. The output current is obtained by mirroring the reference current from the ATE.