Current Mismatch Sensor for Paralleled Semiconductor Devices
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Solution Overview
Problem
Current power modules with paralleled semiconductor devices face challenges in accurately measuring current distribution, leading to potential overheating, reduced lifespan, and uneven power sharing due to current crowding and imbalanced circuit parasitic distribution, which degrades electrical and thermal performance.
Innovation Solution
Integration of a non-intrusive current mismatch sensor, such as a Magneto-Resistive (MR) sensor, within the power module to monitor magnetic flux density between paralleled components, ensuring symmetrical current sharing and optimizing efficiency and reliability by reducing the number of sensing elements and circuit size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple sensing elements are used to measure current in each paralleled device, then measurement precision is improved, but device complexity and circuit size increase
Solution Approach 1:
The patent combines multiple current sensing functions into a single sensing element by measuring the magnetic field generated by the combination of currents from multiple paralleled devices. The magnetic sensor detects the net magnetic flux density resulting from superposition of individual device currents, enabling current distribution measurement without requiring separate sensors for each device.
Solution Approach 2:
The patent introduces magnetic field as an intermediary medium to indirectly measure current distribution. Instead of directly measuring current in each device with separate sensors, the system uses a magnetic sensor to detect the magnetic field generated by current flow, which serves as a mediator to infer current distribution among paralleled devices.
2Measurement precision
If traditional current sensing methods are used for each paralleled device, then measurement completeness is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent merges multiple measurement tasks into a single sensing location. By positioning one magnetic sensor at a strategic location where it can detect the combined magnetic field from multiple paralleled devices, the system eliminates the need for multiple precisely placed sensors, thereby reducing manufacturing precision requirements for sensor placement.
Solution Approach 2:
The magnetic field acts as an intermediary that naturally integrates current information from multiple devices. The magnetic sensor measures the superposition of magnetic fields generated by each device, and through signal processing, the individual current contributions can be determined without requiring precise geometric alignment of multiple sensors.
3Reliability
If comprehensive current monitoring is implemented in power modules, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent combines multiple current monitoring functions into a single integrated sensing circuit. By using one magnetic sensor to monitor the combined magnetic field from multiple paralleled devices and processing the signal to extract individual device current information, the system achieves comprehensive monitoring with reduced circuit complexity compared to using separate sensors and circuits for each device.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively measures current mismatch among paralleled semiconductor devices, enhancing power module reliability, efficiency, and extending the lifespan by ensuring balanced current distribution and reducing conduction losses, while being compact and suitable for high-power applications.
Implementation Method 1
monitor magnetic flux density between paralleled components
Implementation Method 2
a Magneto-Resistive (MR) sensor
Data Source
AI summary
Apparatuses and methods of the present disclosure integrate a non-intrusive current sensor in the form of a current mismatch sensor into a power module having paralleled semiconductor structures or components. The current mismatch can be detected by the current sensor by monitoring a magnetic flux density between the paralleled components or devices.