Current Test Circuit with Sampling Resistor Array for Memory Chips
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Solution Overview
Problem
Existing chip test circuits have low test accuracy and a narrow application range due to their inability to resolve small currents, limiting their effectiveness in measuring the dynamic current range of memory chips like SDRAM, which operates in various states with currents ranging from microamps to milliamperes.
Innovation Solution
A current test circuit comprising a main control component, a sampling resistor array with multiple branches, a voltage test assembly, and a power conversion circuit, where the main control component generates control signals to gate sampling branches, allowing for precise measurement of current by obtaining voltage values across the sampling resistor array and determining resistance values, thereby expanding the measurable current range and improving accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single sampling resistor is used in existing test circuits, then the circuit structure remains simple, but the current measurement range is limited and test accuracy is low
Solution Approach 1:
The sampling resistor is divided into multiple sampling branches (first sampling branch with first sampling resistor, second sampling branch with second sampling resistor, etc.), where each branch can be independently controlled through analog switches. This segmentation allows the circuit to measure different current ranges by selecting appropriate branches, thereby improving measurement accuracy without requiring a completely complex circuit redesign.
Solution Approach 2:
The circuit employs dynamic switching capabilities through analog switches that can connect different sampling branches based on the current measurement requirements. The main control component dynamically selects which sampling branch to use, enabling the circuit to adapt to different current ranges (from microamps to milliamperes) and maintain optimal measurement accuracy across varying operating conditions.
2Adaptability or versatility
If existing test circuits are used, then the device complexity remains low, but the application range is narrow due to inability to measure small currents
Solution Approach 1:
The test circuit is designed with multiple sampling branches that can handle different current magnitudes, making it universally applicable to memory chips operating in various states (active, standby, self-refresh, deep power-down). By incorporating branches with different resistance values and using dynamic switching, the circuit achieves multi-functionality in measuring currents from 10 μA to 500 mA, expanding its application range without proportionally increasing complexity.
3Adaptability or versatility
If multiple sampling branches with different resistance values are used, then the measurable current dynamic range is expanded, but the control complexity increases
Solution Approach 1:
The main control component receives feedback about the memory chip's operating state and automatically selects the appropriate sampling branch based on the expected current range. This feedback mechanism allows the control system to intelligently switch between different sampling branches without requiring complex manual intervention, thereby managing control complexity while maintaining expanded measurement capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the accuracy and expands the application range of current testing, enabling precise measurement of currents across a wide dynamic range, from 10 μA to 500 mA, effectively addressing the limitations of existing test circuits.
Implementation Method 1
obtain voltage values at two ends of the sampling resistor array through the voltage test assembly, and determine the current of the component to be tested according to the voltage values at two ends of the sampling resistor array and resistance values of the sampling resistor array
Data Source
AI summary
A current test circuit can include a sampling resister array with a control end connected with a main control component, a first end is connected with a power conversion circuit, and a second end configured to be connected with a component to be tested. The sampling resistor array includes at least two sampling branches, each having an analog switch and a sampling resistor connected serially. In the test, the main control component can generate a control signal according to the operating state of the component and gate at least one sampling branch of the sampling resistor array through the control signal, obtain voltage values at two ends of the sampling resistor array through a voltage test assembly, and determine the current of the component according to the voltage values at two ends of the sampling resistor array and resistance values of the sampling resistor array.