Curved Electrode Reflectron for Mass Resolution and Field of View

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional reflectrons in time-of-flight mass spectrometers and atom probe microscopes suffer from limited field of view and increased chromatic aberration, which restricts mass resolution and imaging capabilities, especially in three-dimensional atom probes that require ion acceptance over a wide range of angles.

Innovation Solution

A reflectron design featuring curved front and back electrodes with a mesh and annular intermediate electrodes, generating a curved electric field that simulates a point charge, allowing for time focusing and improved space-angle focusing over a wide range of angles, while reducing chromatic aberration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional reflectron with planar ring electrodes is used, then mass resolution is improved through time focusing, but the field of view is limited and chromatic aberration increases

Engineering Contradiction:
Improvemass resolutionVSAvoidfield of view
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent applies curvature to the reflectron electrodes, transforming the conventional planar ring electrodes into a curved geometry. This curvature enables the reflectron to accept ions over a wide range of angles (field of view) while maintaining the time focusing capability that improves mass resolution, and simultaneously reduces chromatic aberration through the curved field configuration

Inventive Principle:
Principle #14Spheroidality (Curvature)

2Adaptability or versatility

If the field of view is increased to accept ions over a wider angle range, then adaptability is improved, but chromatic aberration increases and mass resolution deteriorates

Engineering Contradiction:
Improvefield of viewVSAvoidmass resolution
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The curved electrode geometry creates a specific field configuration that simultaneously achieves wide angle acceptance and maintains ion focusing. The curvature is designed to provide space-angle focusing while preserving time focusing, thereby achieving both wide field of view and high mass resolution without the chromatic aberration penalty of conventional designs

Inventive Principle:
Principle #14Spheroidality (Curvature)

3Productivity

If a curved rear electrode is used to space-angle focus ions, then coupling efficiency is improved, but chromatic aberration increases and imaging resolution is not achieved

Engineering Contradiction:
Improvecoupling efficiencyVSAvoidimaging resolution
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent employs a specific curved geometry in the reflectron electrodes that provides both space-angle focusing (improving coupling efficiency) and time focusing (maintaining mass resolution). The curvature is optimized to reduce chromatic aberration, thereby achieving imaging capability that was not present in previous curved electrode designs

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The patent modifies the electrical parameters and geometric parameters of the reflectron to achieve simultaneous space-angle focusing and time focusing. By carefully controlling the voltage distribution and curvature radius, the system achieves improved coupling efficiency while maintaining imaging resolution and reducing chromatic aberration

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances mass resolution and imaging capabilities by maintaining time focusing and minimizing chromatic aberration, enabling the acceptance of ions over a significantly larger range of angles and reducing magnification, thus improving the overall performance of three-dimensional atom probes.

Implementation Method 1

a front electrode and a back electrode, wherein at least one of the front and back electrodes is configured to generate a curved electric field between the front and back electrodes that intersects an ion path through the reflectron

Methodology Applied
Scientific EffectElectric field: Electric Field

Implementation Method 2

the electrodes are configured to perform time focusing of the ions

Methodology Applied
Scientific EffectTime focusing:

Implementation Method 3

the reflectron is able to provide improved space-angle focusing of ions over a wide range of angles

Methodology Applied
Scientific EffectSpace-angle focusing:

Data Source

PatentEP1880406B1reflectron
Publication Date: 2019.07.03 CAMECA INSTRUMENTS INC
  • EP1880406B1 patent drawingFigure 1~2
  • EP1880406B1 patent drawingFigure 3
  • EP1880406B1 patent drawingFigure 4~5

AI summary

A reflectron (1) for deflecting an ion from a specimen in a time-of -flight mass spectrometer comprises a front electrode (2) and a back electrode (3) . At least one of the front and back electrodes (2,3) is capable of generating a curved electric field. The front and back electrodes are configured to perform time focusing and resolve an image of a specimen.