Curved Mirror Optical System for Semiconductor Line Projection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional optical systems for generating a straight line laser projection are prone to damage from semiconductor material sputtering and have limitations with point sources, require inefficient stepping movements for multiple parallel lines, and struggle with achieving desired line width and length, leading to increased production costs and reduced efficiency.

Innovation Solution

An apparatus using a curved mirror with a point source positioned on or near its axis of revolution, allowing for efficient irradiation of a straight line on a semiconductor substrate, minimizing optical element damage, and enabling simultaneous generation of multiple parallel lines with adjustable length and width, utilizing a point source such as an excimer laser for high-energy, high-speed processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If cylindrical lenses are used to generate a straight line projection, then the line width can be controlled, but the lenses must be positioned very close to the semiconductor substrate, increasing the risk of damage from material sputtering

Engineering Contradiction:
Improveline width controlVSAvoidoptical element durability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

A curved mirror is introduced as an intermediary optical element between the laser source and the semiconductor substrate. The mirror reflects and shapes the laser beam into a straight line projection without requiring close proximity to the substrate, thus protecting the optical element from material sputtering while maintaining precise line width control through proper mirror curvature and positioning.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Shape

If diffractive elements are used to generate a straight line projection, then the line shape can be formed, but the line width is difficult to control given the laser bandwidth and the lifetime of the elements decreases under high energy irradiation

Engineering Contradiction:
Improveline shape formationVSAvoidelement lifetime
Core Design Contradiction:
ShapeVSReliability

Solution Approach 1:

The patent replaces diffractive optical elements with a curved mirror-based reflective system. This substitution eliminates the issues associated with diffractive elements under high energy laser irradiation, including difficulty in controlling line width due to laser bandwidth and reduced element lifetime. The curved mirror provides a more durable and controllable solution for generating straight line projections.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Ease of operation

If a linear irradiation source is used to irradiate straight line shaped regions, then the irradiation can be performed, but the system is not compatible with point sources such as laser sources and requires inefficient stepping movements for multiple parallel lines

Engineering Contradiction:
Improveirradiation capabilityVSAvoidproduction efficiency
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The patent uses a curved mirror to segment and redirect the point source laser beam into multiple parallel straight line projections simultaneously. This allows a single point source to irradiate multiple parallel lines without requiring stepping movements, thereby maintaining ease of operation with laser sources while dramatically improving production efficiency through simultaneous multi-line irradiation.

Inventive Principle:
Principle #1Segmentation

4Area of stationary object

If step-by-step irradiation is used to cover large area semiconductor substrates, then the entire area can be irradiated, but the irradiation speed is slow and production cost is high

Engineering Contradiction:
Improveirradiation coverage areaVSAvoidirradiation speed
Core Design Contradiction:
Area of stationary objectVSProductivity

Solution Approach 1:

The patent merges multiple straight line projections into a single optical system that can irradiate multiple parallel lines simultaneously. By combining the irradiation of multiple lines in one pass, the system covers large area semiconductor substrates much faster than step-by-step irradiation, thereby increasing irradiation speed and reducing production cost while maintaining comprehensive area coverage.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances production speed and cost efficiency by minimizing optical system risk, enabling high-speed, cost-effective irradiation of large-area semiconductor substrates with improved uniformity and flexibility in line length and width, suitable for applications like photovoltaics.

Implementation Method 1

a curved mirror (M) with a reflective surface of revolution, and b) a point source (S) generating an irradiation beam being incident on the curved mirror

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentEP2691978B1Method and apparatus for forming a straight line projection on a semiconductor substrate
Publication Date: 2021.06.16 LASER SYST & SOLUTIONS OF EURO
  • EP2691978B1 patent drawingFigure 1
  • EP2691978B1 patent drawingFigure 2
  • EP2691978B1 patent drawingFigure 3

AI summary

The present invention relates to an apparatus for irradiating a semiconductor comprising a curved mirror with a reflective surface of revolution, and a point source generating an irradiation beam being incident on the curved mirror along an incident direction, characterized in that the curved mirror and the point source form a system having an axis of revolution wherein the point source is provided on or near said axis of revolution, and that said axis of revolution substantially coincides with a straight line projection to be generated on a semiconductor substrate. Additionally, the present invention relates to the use of such apparatus for manufacturing a selective emitter grid, or for irradiating a large area semiconductor surface in a scanning movement.