Curved OLED Bubble Detection Using Multi-Angle Parallel Light
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Solution Overview
Problem
Existing methods fail to timely detect and differentiate bubble defects on curved OLED displays due to interference from particles, stains, and scratches, especially at curved surfaces and R corners, leading to scrapping of products if not detected before photocuring.
Innovation Solution
A method using parallel light from first and second light sources in different directions to capture images with a linear array camera, determining defect regions by analyzing bright spots, and binarizing images to identify bubble defects based on spaced bright spots.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If common camera detection is used, then the detection system is simple, but bubble defects at curved surfaces and R corners cannot be detected due to interference from particles, stains, and scratches
Solution Approach 1:
The patent segments the detection task by using multiple light sources from different directions to create multiple images of the same substrate. Each light source illuminates specific defect types differently, allowing the system to segment bubble defects from interference factors through comparative analysis of multiple images.
Solution Approach 2:
The patent adds the dimension of multiple illumination angles by introducing light sources from different directions. This transforms the single-view detection into multi-angle detection, enabling the system to distinguish bubble defects from interference factors that appear differently under various lighting conditions.
2Productivity
If batch bubble removal is performed without timely detection, then production efficiency is high, but products with bubble defects enter subsequent processes and cause waste
Solution Approach 1:
The patent implements preliminary detection of bubble defects before photocuring using the multi-light-source imaging system. By detecting defects in advance and enabling secondary bubble removal, the system prevents defective products from entering subsequent processes, thereby maintaining both high productivity and product quality.
3Reliability
If detection is performed after photocuring, then the product is stable, but bubble defects cannot be removed and products must be scrapped
Solution Approach 1:
The patent performs detection before photocuring to identify bubble defects while the product is still in a removable state. This preliminary detection enables timely intervention through secondary bubble removal, preventing the need to scrap entire products and reducing material waste.
4Measurement precision
If multiple light sources are used to improve detection accuracy, then bubble defects can be differentiated from interference, but the detection time increases
Solution Approach 1:
The patent uses multiple light sources that can illuminate the substrate in a sequential or coordinated periodic manner, capturing multiple images in rapid succession. This periodic illumination strategy enables the system to gather multi-angle information quickly, maintaining high detection accuracy while minimizing detection time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances detection efficiency and accuracy by highlighting bubble defects as multiple spaced bright spots, allowing immediate sorting of defective products without manual inspection, meeting timeliness and cost constraints.
Implementation Method 1
a linear array camera, which is located in a transmission path of reflected light that is the parallel light provided by the first light source and specularly reflected off the to-be-tested substrate
Data Source
AI summary
A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.