Curved Scan Line Thin Film Transistor Substrate for Display Repair
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Solution Overview
Problem
Thin film transistor substrates face short circuit defects between scan and data lines during manufacturing, leading to degraded image quality and electrical characteristics, with existing repair methods causing additional defects due to particle by-products.
Innovation Solution
The substrate design includes first and second conductive lines with curved portions, where the curved portion overlaps with the data line closer to the first pixel electrode, creating a separation region that reduces the impact of by-products during laser cutting and maintains distinct distances between conductive lines and pixel electrodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If scan lines and data lines are formed in different layers with insulating layers between them, then short circuit defects occur during manufacturing, but image quality characteristics degrade
Solution Approach 1:
The scan line is designed with a curved portion instead of a straight line, creating an overlapping region that overlaps with the data line in the plan view. This curved configuration allows the scan line to be positioned closer to one pixel electrode while maintaining adequate distance from the other pixel electrode, thereby preventing short circuit defects during manufacturing while preserving image quality characteristics.
Solution Approach 2:
The distance between the scan line and pixel electrodes is made non-uniform through the curved portion design. The scan line is positioned closer to the first pixel electrode than to the second pixel electrode, creating different local spacing relationships that prevent short circuits while maintaining proper electrical characteristics for image display.
2Reliability
If laser cutting method is used to repair short circuit defects, then short circuit is fixed, but particles or by-products affect pixel electrodes causing additional defects
Solution Approach 1:
The curved portion of the scan line creates a specific overlapping region with the data line that is positioned closer to the first pixel electrode. This geometric configuration allows repair operations to be performed with reduced impact on pixel electrodes, minimizing the generation and deposition of harmful particles and by-products during the repair process.
3Reliability
If curved portion of scan line overlaps with data line closer to first pixel electrode, then electrical characteristics are maintained, but manufacturing complexity increases
Solution Approach 1:
The scan line incorporates a curved portion that creates an overlapping region with the data line. This curved configuration is designed to overlap with the data line in a controlled manner closer to the first pixel electrode, maintaining electrical characteristics while the overlapping region is positioned to minimize interference with pixel electrode operations.
Data Source
AI summary
A thin film transistor and a display apparatus include: a substrate; a plurality of first conductive lines formed on the substrate, each including a main body and a curved portion connected to the main body; a plurality of second conductive lines crossing the curved portions of the first conductive lines; and a plurality of pixel electrodes formed adjacent to the first conductive lines. The plurality of pixel electrodes includes a first pixel electrode disposed toward a side of one first conductive line, and a second pixel electrode disposed toward the other side of the one first conductive line. The display apparatus also includes an intermediate layer connected to the pixel electrodes for displaying images and an opposite electrode formed thereon.


