Curved-Path Sputter Deposition for Uniform Target Erosion

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Solution Overview

Problem

Existing sputter deposition techniques using magnetrons result in non-uniform target material deposition due to circular 'racetrack' erosion, limiting target utilization and affecting deposition uniformity.

Innovation Solution

A sputter deposition apparatus with a substrate guide and target portion defining a deposition zone, utilizing a confining magnetic field with curved magnetic field lines to guide plasma along a curved path, ensuring uniform plasma confinement and deposition across a larger substrate area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a magnetron is used for sputter deposition, then the deposition rate is increased, but the target material erosion becomes non-uniform (circular racetrack shape) reducing target utilization

Engineering Contradiction:
Improvedeposition rateVSAvoidtarget utilization
Core Design Contradiction:
ProductivityVSLoss of substance

Solution Approach 1:

The substrate guide is configured to follow a curved path through the plasma region, matching the natural curvature of plasma confinement. This curved geometry allows the substrate to traverse the entire plasma distribution area, ensuring uniform exposure and deposition across the substrate surface while maintaining high deposition rates, thereby resolving the contradiction between productivity and target utilization

Inventive Principle:
Principle #14Spheroidality (Curvature)

2Productivity

If a magnetron is used for sputter deposition, then the deposition rate is increased, but the uniformity of deposition across the substrate is reduced

Engineering Contradiction:
Improvedeposition rateVSAvoiddeposition uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The curved path of the substrate guide through the plasma region ensures that the substrate passes through areas of varying plasma density, averaging out the deposition rate across its surface. This results in uniform film thickness and composition while maintaining the high deposition rates characteristic of magnetron sputtering

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The substrate is pre-positioned on a curved guide path before entering the plasma region, ensuring optimal exposure to the plasma distribution. This preliminary configuration of the substrate trajectory allows for uniform deposition across the entire substrate surface while maintaining high productivity

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus achieves more uniform and efficient sputter deposition on a larger substrate area, reducing the need for quality control and enhancing the consistency of the processed substrate.

Implementation Method 1

a confining arrangement comprising one or more magnetic elements arranged to provide a confining magnetic field to confine plasma in the deposition zone

Methodology Applied
Scientific EffectMagnetic field confinement: Magnetic Field

Implementation Method 2

the confining magnetic field being characterised by magnetic field lines arranged to, at least in the deposition zone, substantially follow a curve of the curved path so as to confine said plasma around said curve

Methodology Applied
Scientific EffectLorentz force: Lorentz Force

Implementation Method 3

Bombardment of the target by ions of the plasma eject target material which may then deposit on the substrate surface

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 4

Bombardment of the target by ions of the plasma eject target material

Methodology Applied
Scientific EffectIon bombardment: Ion Beam

Implementation Method 5

a substrate guide arranged to guide a substrate along a curved path

Methodology Applied
Scientific EffectMechanical transport:

Data Source

PatentUS12460300B2Method and apparatus for sputter deposition of target material to a substrate
Publication Date: 2025.11.04 DYSON TECH LTD
  • US12460300B2 patent drawing
  • US12460300B2 patent drawing
  • US12460300B2 patent drawing

AI summary

Apparatus for sputter deposition of target material to a substrate is disclosed. In one form, the apparatus includes a substrate guide arranged to guide a substrate along a curved path and a target portion spaced from the substrate guide and arranged to support target material. The target portion and the substrate guide define between them a deposition zone. The apparatus includes a confining arrangement including one or more magnetic elements arranged to provide a confining magnetic field to confine plasma in the deposition zone thereby to provide for sputter deposition of target material to the web of substrate in use. The confining magnetic field includes magnetic field lines arranged to, at least in the deposition zone, substantially follow a curve of the curved path so as to confine said plasma around said curve of the curved path.