Curved X-ray Detector Modules for Uniform Image Quality

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional flat X-ray detectors suffer from decreased image quality and increased noise at edge regions due to oblique X-radiation incidence, leading to lower signal-to-noise ratios and spatial resolution issues, especially when the focus-detector distance changes, making them less suitable for industrial applications with varying measuring conditions.

Innovation Solution

An X-ray detector system with adjustable detector modules arranged on a circular arc, allowing the normals to each detection plane to intersect at a reference region, ensuring perpendicular X-radiation incidence and maintaining consistent radiation dose across all modules, thereby improving spatial resolution and noise performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a flat detector is used, then the detector is easy to manufacture and manage, but image quality decreases towards edge regions due to oblique X-radiation incidence

Engineering Contradiction:
Improvedetector manufacturingVSAvoidimage quality
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent applies curvature by arranging detector modules along a circular arc instead of using a flat detector plane. This curved arrangement ensures that all detector modules are oriented perpendicular to the X-ray source, eliminating oblique incidence at edge regions and maintaining uniform image quality across the entire detection area while preserving manufacturing simplicity through modular construction

Inventive Principle:
Principle #14Spheroidality (Curvature)

2Device complexity

If a flat detector is used, then the detector structure is simple, but spatial resolution is deteriorated at edge regions due to oblique transmission through the sensor layer

Engineering Contradiction:
Improvedetector structureVSAvoidspatial resolution
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

By configuring detector modules along a circular arc, the patent ensures that X-radiation impinges perpendicularly on each module's sensor layer, eliminating oblique transmission that causes signal blurring and spatial resolution deterioration. This curved geometry maintains simple modular structure while significantly improving spatial resolution uniformity across all detection regions

Inventive Principle:
Principle #14Spheroidality (Curvature)

3Device complexity

If a point-shaped radiation source and flat detector are used, then the setup is simple, but different dose rates result from different distances between source and detector modules

Engineering Contradiction:
Improvesetup complexityVSAvoiddose rate uniformity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent arranges detector modules along a circular arc centered at the X-ray source, ensuring all modules are equidistant from the source. This curved configuration creates uniform dose rates across all detector modules, eliminating the dose rate variation problem inherent in flat detector setups, while maintaining simple modular construction

Inventive Principle:
Principle #14Spheroidality (Curvature)

4Measurement precision

If bent detectors are used, then angle of incidence is location-independent, but focus-detector distance cannot be changed

Engineering Contradiction:
Improveangle of incidence uniformityVSAvoidfocus-detector distance adjustability
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent implements a dynamic configuration where detector modules can be adjusted along their circular arc arrangement, allowing the focus-detector distance to be changed while maintaining perpendicular incidence geometry. This dynamic adaptability enables the system to accommodate varying measurement requirements without sacrificing angle of incidence uniformity

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

By dividing the detector into multiple independently adjustable modules arranged on a circular arc, the patent enables flexible adjustment of the overall focus-detector distance while maintaining the perpendicular incidence geometry for each individual module, thus achieving both adaptability and measurement precision

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The adjustable detector system enhances imaging precision and flexibility, maintaining high signal-to-noise ratios and spatial resolution across the entire detection region, even when the focus-detector distance varies, and allows for precise focusing on the radiation source, reducing 'dead regions' and improving image quality.

Implementation Method 1

detect an absorption profile which results from transmission of an object by X-radiation

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Data Source

PatentUS9907523B2X-ray detector and X-ray system
Publication Date: 2018.03.06 FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV
  • US9907523B2 patent drawing
  • US9907523B2 patent drawing
  • US9907523B2 patent drawing

AI summary

An X-ray detector has a first detector module, a second detector module and manipulation means. The first detector module includes a first detection region arranged in a first detection plane, the second detector module includes a second detection region arranged in a second detection plane, which is adjacent to the first detection region. The manipulation means is configured to orient the first detection plane of the first detector module and the second detection plane of the second detector module to each other such that a first normal to surface of the first detection plane and a second normal to surface of the second detection plane intersect within a reference region.