Continuous Curvilinear Scanning Probe Microscopy for Ambient Force Measurement

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Solution Overview

Problem

Conventional atomic force microscopy (AFM) systems face challenges in measuring interaction forces under ambient conditions due to capillary condensation, which introduces additional adhesion forces and complicates the measurement of magnetic, van der Waals, or electrostatic forces, and cyclic scanning methods do not allow for constant linear speed, leading to non-stationary measurements.

Innovation Solution

Implementing a continuous curvilinear relative displacement of the probe with respect to the sample using harmonic voltages applied to piezoelectric actuators, allowing for uniform movement without stopping or sudden speed changes, thereby avoiding capillary condensation and enabling constant-speed measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If cyclic scanning mode is used in conventional AFM, then the measurement can be performed under ambient conditions, but capillary condensation occurs introducing additional adhesion forces and the measurement speed cannot be constant

Engineering Contradiction:
ImproveMeasurement under ambient conditionsVSAvoidMeasurement of interaction forces
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent applies curvilinear continuous motion (circular or elliptical trajectories) of the probe relative to the sample surface, replacing the conventional cyclic back-and-forth linear scanning. This curvilinear motion eliminates stopping and reversing, preventing capillary condensation formation while maintaining ambient operation, thus resolving the contradiction between ease of operation and measurement precision

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The patent implements continuous unidirectional curvilinear scanning motion that never stops or reverses, ensuring the probe continuously moves along a closed curve. This continuous action prevents the stationary periods that cause capillary condensation, enabling precise force measurements under ambient conditions without the harmful effects of cyclic scanning

Inventive Principle:
Principle #20Continuity of useful action

2Area of stationary object

If cyclic scanning is performed with stopping at turning points, then the scan can cover the entire surface, but the measurement speed varies and stationary state cannot be observed

Engineering Contradiction:
ImproveSurface coverage areaVSAvoidConstant linear speed
Core Design Contradiction:
Area of stationary objectVSSpeed

Solution Approach 1:

By using circular or elliptical curvilinear trajectories, the probe continuously covers the surface area while maintaining constant speed throughout the entire measurement cycle. The curved path eliminates the need for stopping and reversing at turning points, thus achieving both complete surface coverage and constant measurement speed simultaneously

Inventive Principle:
Principle #14Spheroidality (Curvature)

3Ease of operation

If the probe stops or changes direction during scanning, then cyclic scanning can be performed, but capillary condensation forms adding adhesion forces of several tens of nN

Engineering Contradiction:
ImproveCyclic scanning capabilityVSAvoidCapillary condensation and adhesion forces
Core Design Contradiction:
Ease of operationVSObject-generated harmful factors

Solution Approach 1:

The continuous curvilinear motion ensures the probe never stops or reverses direction, maintaining constant movement along a closed curve. This eliminates the stationary periods necessary for capillary condensation to form, thereby removing the harmful adhesion forces while preserving the ability to perform complete surface scans under ambient conditions

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise, constant-speed measurements of interaction forces, including adhesion and friction forces, without the interference of capillary forces, and enables higher displacement speeds, facilitating surface modifications and improved measurement accuracy.

Implementation Method 1

harmonic voltages applied to piezoelectric actuators, allowing for uniform movement without stopping or sudden speed changes

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Implementation Method 2

This deflection is generally detected by an optical system consisting of a laser beam which is reflected on the end of the cantilever and whose path is guided using mirrors, and then picked up by a photodetector

Methodology Applied
Scientific EffectOptical reflection: Reflection

Implementation Method 3

a nano meniscus of capillary condensation due to the humidity of the air and the hydrophilicity of the surfaces can form between the tip and the surface, typically for contact times close to and beyond a millisecond. Laplace's depression in this capillary condensation meniscus generates an adhesion force

Methodology Applied
Scientific EffectCapillary condensation: Capillary Condensation

Implementation Method 4

the non-contact mode: the cantilever oscillates near the surface of the sample around its resonance frequency at a low amplitude of the order of a few nm

Methodology Applied
Scientific EffectResonance: Resonance

Implementation Method 5

It is the attractive forces which dominate (forces of Van der Waals, magnetic, electrostatic...)

Methodology Applied
Scientific EffectVan der Waals force: Van der Waals Force

Data Source

PatentEP2567244B1Methods of measurement and of modification of a surface through a local probe microscope working in a continuous curvilinear mode, local probe microscope and device for their realisation
Publication Date: 2020.12.09 UNIVERSITE DU MAINE
  • EP2567244B1 patent drawingFigure 1~2b
  • EP2567244B1 patent drawingFigure 2c~3c
  • EP2567244B1 patent drawingFigure 4a~4c

AI summary

The invention relates to processes for the modification of surfaces and on processes for the measurement of adhesion forces and of different forces of interaction (friction forces, adhesion forces) by scanning probe microscopy functioning in continuous <<curvilinear>> mode, as well as to a scanning probe microscope and a device permitting the implementation of said processes.