Cut Face Probe for Intersecting Surface Measurement
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Solution Overview
Problem
Conventional contact-type measuring methods face challenges in achieving high precision for complex shapes, particularly when measuring workpieces with intersecting faces, due to difficulties in producing small spherical probes, weak bonding between the probe and support bar, and probe support shaft bending, which leads to measurement interference and errors.
Innovation Solution
A shape measuring device with a probe having a cut face nearly vertical to its support shaft, allowing the sphere to contact the workpiece without interference, enabling precise measurement by using a larger sphere and enhancing bonding strength while preventing support shaft bending through a probe drive system that includes a base platform, stages, and a control device for accurate positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the R of the tip sphere of a probe is reduced to a level of several tens of micrometers to prevent physical interference with intersecting faces, then measurement interference is avoided, but production difficulty increases and manufacturing precision deteriorates
Solution Approach 1:
The probe is designed with an asymmetric structure featuring a cut face that removes part of the spherical tip, creating a directional measurement capability. This dimensional modification allows the probe to approach and measure surfaces from specific angles while avoiding interference from intersecting faces, thereby enabling the use of larger sphere radii without measurement interference.
2Object-affected harmful factors
If the R of the tip sphere of a probe is reduced to a level of several tens of micrometers, then measurement interference is avoided, but bonding strength between the sphere and support bar deteriorates
Solution Approach 1:
By introducing a cut face that asymmetrically removes material from the spherical tip, the design enables directional measurement while maintaining a larger overall sphere size. This larger sphere provides sufficient bonding area between the probe sphere and support bar, ensuring adequate bonding strength while still avoiding measurement interference through the directional capability provided by the cut face.
3Object-affected harmful factors
If the R of the tip sphere of a probe is reduced to a level of several tens of micrometers, then measurement interference is avoided, but the support bar bends under measuring pressure causing measurement errors
Solution Approach 1:
The cut face creates a directional measurement probe that can approach workpiece surfaces from specific angles. This directional capability allows the use of larger sphere radii, which in turn enable the use of thicker support bars that are sufficiently rigid to resist bending under measuring pressure, thereby eliminating measurement errors while avoiding interference with intersecting faces.
4Measurement precision
If a spherical probe tip is used to achieve high precision measurement in submicron dimensions, then measurement precision is improved, but adaptability to complex shapes with intersecting faces deteriorates
Solution Approach 1:
The probe design incorporates a cut face that asymmetrically modifies the spherical tip, creating directional measurement capability. This modification maintains the high precision measurement capability of the spherical tip while enabling the probe to access and measure complex shapes with intersecting faces by approaching from specific directions, thereby improving adaptability without sacrificing measurement precision.
Solution Approach 2:
The cut face creates a localized modification on the spherical probe tip, concentrating the directional measurement capability at the specific region where the cut is made. This local quality change allows the probe to maintain spherical contact for high precision measurement while the cut face provides the directional control needed for complex geometries.
Data Source
AI summary
A shape measuring device to measure a shape of a workpiece, wherein the shape measuring device includes:the probe;a probe support shaft to pivotally support the probe; anda probe drive device to which the probe support shaft is attached to contact the probe with a measuring position of the workpiece and to move relatively the workpiece and the probe;wherein the probe is a sphere pivotally supported by the probe support shaft and has a cut face which is a shape cut so as to be nearly vertical to the probe support shaft anda shape measurement of a workpiece surface is carried out in such a manner that the cut face of the probe is faced with a face intersecting a face containing the measuring position of the workpiece surface, and a surface of the sphere is contacted with the measuring position of the workpiece.