Metal-Film Etching Composition with Cyclometallated Accelerators

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Solution Overview

Problem

Current etching processes for semiconductor manufacturing face challenges in achieving high etching selectivity and efficiency for metal-containing films, often resulting in surface residue and reduced electrical characteristics due to inadequate etching compositions.

Innovation Solution

An etching composition comprising an oxidizer, an ammonium salt, and an accelerator, where the accelerator includes a first and second compound capable of forming cyclometallated rings, is used to enhance etching selectivity and rate for metal-containing films, specifically targeting films like titanium nitride and aluminum nitride.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional etching compositions are used for metal-containing films, then the etching process can be performed, but the etching selectivity to adjacent films deteriorates and surface residue remains

Engineering Contradiction:
Improveetching selectivityVSAvoidsurface residue
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent changes the chemical parameters of the etching composition by incorporating specific accelerators (compounds capable of forming cyclometallated rings) along with oxidizers and ammonium salts. This parameter change enables high etching rates for metal-containing films while maintaining excellent selectivity and preventing surface residue formation, directly resolving the technical contradiction between achieving effective etching and avoiding harmful residues.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If etching composition provides high etching rate, then productivity increases, but etching selectivity to adjacent films deteriorates

Engineering Contradiction:
Improveetching rateVSAvoidetching selectivity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent creates a composite etching composition system combining oxidizers (such as hydrogen peroxide), ammonium salts (such as ammonium fluoride), and accelerators (compounds capable of forming cyclometallated rings). This composite formulation achieves synergistic effects where the accelerator enhances the etching rate for metal-containing films while the ammonium salt provides selectivity control, resolving the contradiction between high productivity and manufacturing precision.

Inventive Principle:
Principle #40Composite materials

3Device complexity

If single accelerator is used in etching composition, then composition is simple, but etching performance and stability deteriorate

Engineering Contradiction:
Improvecomposition complexityVSAvoidstorage stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent merges multiple accelerator compounds into a single etching composition formulation, combining their effects to achieve both high etching performance and excellent storage stability. This combination approach allows the composition to maintain reliability over time while providing consistent etching rates, resolving the contradiction between simplicity and reliability.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The etching composition significantly improves etching selectivity and rate, reducing surface residue and enhancing the productivity of the etching process, leading to improved semiconductor device performance.

Implementation Method 1

an oxidizer

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 2

the first compound may be a compound capable of forming a cyclometallated 5-membered ring or a cyclometallated 6-membered ring, which comprises a metal or metal ion combined with at least one of O, S, and N

Methodology Applied
Scientific EffectCyclometallation: Chemical Bonding

Data Source

PatentEP4481014A1Etching composition, metal-containing film etching method using the same and semiconductor device manufacturing method using the same
Publication Date: 2024.12.25 SAMSUNG ELECTRONICS CO LTD
  • EP4481014A1 patent drawingFigure 1
  • EP4481014A1 patent drawingFigure 2~3
  • EP4481014A1 patent drawing

AI summary

An etching composition may include an oxidizer, an ammonium salt, an aqueous solvent, and an accelerator. A method of etching a metal-containing film may be performed using the etching composition, and a method of manufacturing a semiconductor device may be performed using the etching composition.