Cylindrical Gas Ejection Nozzle Layout for Uniform Wafer Processing

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Solution Overview

Problem

In vertical type substrate processing apparatuses, the process gas flow path area is reduced, making it difficult to control the gas flow inside the process vessel effectively.

Innovation Solution

An ejection apparatus with cylindrical nozzles is positioned beside the substrate, featuring ejection holes that direct gas flow both parallel and inclined to the substrate surface, enhancing gas distribution and flow path area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If process gas is supplied toward the center of each wafer using a conventional nozzle, then the nozzle structure is simple, but the flow path area of the process gas is reduced and gas flow control becomes difficult

Engineering Contradiction:
Improvenozzle structureVSAvoidflow path area
Core Design Contradiction:
Device complexityVSArea of stationary object

Solution Approach 1:

The patent transitions from a single-dimension gas supply approach (center-directed) to a multi-dimensional approach by arranging ejection holes in multiple directions (vertical, inclined, and horizontal surfaces) of the cylindrical nozzle, thereby expanding the flow path area and improving gas distribution

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The nozzle is segmented into multiple ejection surfaces (vertical, inclined, and horizontal) with ejection holes distributed across different directions, allowing the gas flow to be divided into multiple pathways that collectively increase the total flow path area

Inventive Principle:
Principle #1Segmentation

2Device complexity

If process gas is supplied toward the center of each wafer, then the nozzle configuration is simple, but the uniformity of gas distribution across the substrate surface deteriorates

Engineering Contradiction:
Improvenozzle configurationVSAvoidgas distribution uniformity
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

Different surfaces of the cylindrical nozzle are equipped with ejection holes oriented in different directions (vertical, inclined, horizontal) to create locally optimized gas distribution patterns that collectively achieve uniform coverage across the entire substrate surface

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The cylindrical nozzle features asymmetric ejection hole arrangements on different surfaces (with inclined surfaces at specific angles), breaking the symmetry of conventional center-directed nozzles to achieve more uniform gas distribution across the substrate

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves gas flow control and distribution, ensuring uniform processing across the substrate surface.

Implementation Method 1

configured to eject the gas substantially in a same direction; and a second ejection hole arranged on at least one of the two surfaces and configured to eject the gas in a direction inclined with respect to the same direction

Methodology Applied
Scientific EffectGas flow:

Data Source

PatentUS20260009134A1Substrate processing apparatus, ejection apparatus, substrate processing method, method of manufacturing semiconductor device and non-transitory computer-readable recording medium
Publication Date: 2026.01.08 KOKUSAI DENKI KK
  • US20260009134A1 patent drawing
  • US20260009134A1 patent drawing
  • US20260009134A1 patent drawing

AI summary

It is possible to increase a flow path area of a process gas. There is provided a technique that includes: an ejection apparatus beside a substrate, extending along a direction perpendicular to the substrate, and configured to eject a gas onto the substrate, wherein the ejection apparatus includes: a first nozzle and a second nozzle, and wherein each of the first nozzle and the second nozzle is provided with: a flat surface facing the substrate; two surfaces connected to both sides of the flat surface; a plurality of first ejection holes arranged on the flat surface along a direction parallel to the substrate and configured to eject the gas substantially in a same direction; and a second ejection hole arranged on at least one of the two surfaces and configured to eject the gas in a direction inclined with respect to the same direction.