D2D Interconnect Clock-Gating to Mitigate Transistor Aging

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Solution Overview

Problem

Transistor aging occurs due to improper management of clock and data lanes during clock-gating events in die-to-die (D2D) interconnects, leading to performance degradation in multichip packaging.

Innovation Solution

Implementing clock-gating techniques that set data lanes to the last transmitted state for unterminated links and high-impedance state for terminated links, and alternating the clock lane state between high and low during sequential clock-gating events to mitigate transistor aging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Use of energy by moving object

If clock-gating is implemented to reduce power consumption during idle periods, then energy efficiency is improved, but transistor aging accelerates due to improper lane state management

Engineering Contradiction:
Improvepower consumptionVSAvoidtransistor aging
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

The patent applies different state management strategies to different lanes based on their termination status. Terminated links use high-impedance state while unterminated links use last-transmitted state, optimizing each lane's behavior for its specific electrical characteristics to prevent aging during clock-gating

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements periodic alternation of clock lane states between high and low during sequential clock-gating events. This periodic switching prevents transistors from remaining in the same state for extended periods, thereby mitigating aging effects while maintaining power savings

Inventive Principle:
Principle #19Periodic action

2Stability of the object's composition

If data lanes are held in a fixed state during clock-gating, then circuit stability is improved, but transistor aging occurs due to lack of state variation

Engineering Contradiction:
Improvecircuit stabilityVSAvoidtransistor aging
Core Design Contradiction:
Stability of the object's compositionVSReliability

Solution Approach 1:

The patent introduces periodic state alternation for clock lanes during sequential clock-gating events, switching between high and low states. This prevents transistors from being stuck in one state indefinitely, reducing aging while maintaining signal integrity through controlled stability

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent makes the lane states dynamic rather than static during clock-gating. By alternating clock lane states and conditionally setting data lanes based on termination status, the system adapts lane behavior to balance stability requirements with aging mitigation needs

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12362306B2Clock-gating in die-to-die (D2D) interconnects
Publication Date: 2025.07.15 INTEL CORP
  • US12362306B2 patent drawing
  • US12362306B2 patent drawing
  • US12362306B2 patent drawing

AI summary

Embodiments herein relate to action that are to be taken on various lanes of a die-to-die (D2D) interconnect in the event of clock-gating. Specifically, based on identification that a clock-gating event is to occur, physical layer (PHY) logic may direct PHY electrical circuitry to set the state of various of the lanes. In some embodiments, different actions may be taken based on whether the D2D interconnect is terminated or unterminated. Other embodiments may be described and claimed.