DAC Cell Skew Measurement Using TDC-Based Timing Correction

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Solution Overview

Problem

Current digital-to-analog converters (DACs) face performance limitations due to timing skew errors, which are not effectively corrected and become significant at higher sampling and signal frequencies, impacting linearity and noise.

Innovation Solution

The implementation of a time-to-digital converter (TDC) within the DAC to measure timing skew errors on a per-cell basis, allowing for the generation of correction signals to mitigate these errors, thereby improving DAC performance without increasing device size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If device size is increased to improve matching and reduce random skew errors, then skew error performance is improved, but area and power dissipation increase

Engineering Contradiction:
Improveskew error performanceVSAvoiddevice area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent replaces physical scaling of DAC cells with a measurement and correction system. A time-to-digital converter (TDC) measures timing skew errors, and a correction DAC generates compensating signals to cancel these errors. This substitution of physical enlargement with active correction resolves the contradiction by achieving low skew errors without increasing device area.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent implements a feedback loop where the TDC continuously measures timing skew errors from the DAC cells, and the correction DAC applies compensating signals based on these measurements. This feedback mechanism dynamically corrects skew errors without requiring larger device sizes, resolving the contradiction between skew error performance and area.

Inventive Principle:
Principle #23Feedback

2Reliability

If device size is increased to improve matching and reduce random skew errors, then skew error performance is improved, but power dissipation increases

Engineering Contradiction:
Improveskew error performanceVSAvoidpower dissipation
Core Design Contradiction:
ReliabilityVSUse of energy by stationary object

Solution Approach 1:

The patent replaces power-intensive physical scaling with a measurement and correction architecture. The TDC and correction DAC consume less power than would be required to scale up all DAC cells for improved matching, resolving the contradiction between skew error performance and power dissipation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent uses a separate correction DAC that generates compensating signals based on measured errors, rather than physically enlarging the main DAC cells. This copying approach achieves the desired performance with lower power consumption compared to scaling the entire DAC structure.

Inventive Principle:
Principle #26Copying

3Device complexity

If timing skew errors are not corrected, then device complexity is reduced, but DAC performance deteriorates at higher sampling and signal frequencies

Engineering Contradiction:
Improvedevice complexityVSAvoidDAC performance
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent introduces a TDC as an intermediary measurement device and a correction DAC as an intermediary correction device. These intermediaries enable skew error correction without fundamentally redesigning the main DAC structure, achieving high performance at high frequencies while maintaining relatively simple device architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent separates the DAC into main DAC cells for signal conversion and a correction DAC for skew error compensation. This segmentation allows each component to be optimized independently, achieving high performance without excessive overall complexity.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentEP4568115A1Method and apparatus for skew error measurement in a digital-to-analog converter using a time-to-digital converter
Publication Date: 2025.06.11 INTEL CORP
  • EP4568115A1 patent drawingFigure 1
  • EP4568115A1 patent drawingFigure 2
  • EP4568115A1 patent drawingFigure 3A~3B

AI summary

Method and apparatus for skew error measurement and correction in a digital-to-analog converter (DAC) using a time-to-digital converter (TDC). A DAC includes a main DAC and a TDC. The main DAC includes a plurality of DAC cells. The main DAC is configured to generate an analog output signal based on digital input data. The TDC is coupled to an output of the main DAC and configured to measure a timing error of the main DAC. The timing error may be measured on a DAC cell basis or a subset of DAC cells basis.