DAG-Based Device Criticality Analysis for Hot-Plug Stability

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Solution Overview

Problem

Current computer systems lack an efficient method to determine device criticality during hot-plugging operations in multi-path configurations, which can lead to system instability and performance degradation due to the inability to analyze the impact of hot-plugging on device availability and resource allocation effectively.

Innovation Solution

A method utilizing a directed acyclic graph (DAG) to represent the platform hierarchy and perform critical resource analysis, allowing for the determination of device criticality by traversing the graph and assessing the number of paths affected by hot-plugging operations, thereby identifying potentially critical devices and their impact on system functionality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If hot-plugging operations are performed in multi-path computer configurations, then device availability and system flexibility are improved, but system stability and integrity deteriorate due to inability to analyze impact effectively

Engineering Contradiction:

Improvedevice availabilityVSAvoidsystem stability

Core Design Contradiction:

Adaptability or versatilityVSReliability

Solution Approach 1:

The patent performs Critical Resource Analysis (CRA) before executing hot-plugging operations to identify potentially critical devices and assess their impact on system functionality. This preliminary analysis prevents system instability by detecting devices that would cause performance degradation or compromise system integrity before the hot-plugging operation occurs.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The system provides feedback about device criticality and potential system impact during hot-plugging operations. By analyzing the directed acyclic graph to determine affected devices and their criticality, the system can inform operators about potential consequences before completing the hot-plug operation, allowing for informed decisions that maintain system reliability.

Inventive Principle:

Principle #23Feedback

2Reliability

If Critical Resource Analysis is performed to determine device criticality, then system integrity is protected, but processing time and computational resources increase

Engineering Contradiction:

Improvesystem integrityVSAvoidprocessing time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the system into a directed acyclic graph structure where devices, paths, and resources are represented as discrete nodes and edges. This segmentation allows the Critical Resource Analysis to focus only on affected sub-graphs when a hot-plugging event occurs, rather than analyzing the entire system, thereby reducing processing time while maintaining comprehensive integrity checking.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The system performs partial analysis by focusing only on potentially critical devices and their associated paths in the directed acyclic graph, rather than conducting a complete system-wide analysis for every hot-plugging operation. This selective approach maintains system integrity protection while minimizing the time and computational resources required.

Inventive Principle:

Principle #16Partial or excessive action

Data Source

PatentUS7610429B2Method and system for determining device criticality in a computer configuration

Publication Date: 2009.10.27 VALTRUS INNOVATIONS LTD

AI summary

A method for determining the criticality of a device in a multi-path computer configuration comprising the steps of: traversing a directed acyclic graph representing a platform hierarchy; and determining paths within the directed acyclic graph affected by the removal of the device. A computer system comprising a directed acyclic graph data structure representing a platform hierarchy; and a control arrangement for traversing the directed acyclic graph to determining paths therein affected by removal of a device.