Dark Helix Optical Measuring Process
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current superresolution microscopy techniques face limitations in achieving high accuracy, simplicity, robustness, and ease of use, particularly in observing biological samples at scales smaller than 200 nm, due to complex instrumentation, high light intensities, and inability to simultaneously measure multiple fluorophores, which hinders their application in research and diagnostics.
Innovation Solution
An optical measuring device and process utilizing an achromatic projection module, scanning module, detection module, and image acquisition module, combined with Bayesian algorithms and MAP algorithms, to determine the spatial distribution of re-emitting sources, enabling compact light distribution and sequence of images for enhanced resolution and in-vivo diagnostics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex instrumentation is used to achieve superresolution microscopy, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent changes the parameter of light distribution topology from conventional Gaussian profiles to dark helix patterns with specific topological charges. This parameter change enables superresolution capability through the unique interference properties of dark helix light distributions, achieving high spatial resolution without requiring complex multi-component instrumentation systems.
Solution Approach 2:
Instead of using conventional bright-field illumination patterns, the patent employs dark-field or hollow-core light distributions (dark helix patterns with zero intensity at the center). This inverted approach creates high-contrast imaging conditions that enhance measurement precision for detecting re-emitting sources while maintaining relatively simple optical hardware.
2Measurement precision
If high light intensities are used in superresolution microscopy, then measurement precision is improved, but object-generated harmful factors increase
Solution Approach 1:
The patent employs sequential or alternating projection of different dark helix light distributions with varying topological charges rather than continuous high-intensity illumination. This periodic action allows the biological sample to recover between illumination cycles, reducing cumulative photodamage while maintaining high spatial resolution through the accumulated measurement data from multiple cycles.
3Ease of operation
If conventional microscopy techniques are used, then ease of operation is maintained, but measurement precision deteriorates
Solution Approach 1:
The patent designs the optical measuring device to maintain compatibility with conventional microscopy operational procedures while adding the capability to project and detect dark helix light distributions. The system can operate in both conventional and superresolution modes, allowing users to leverage existing expertise and protocols while achieving enhanced spatial resolution when needed.
4Measurement precision
If existing superresolution methods are used, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent performs preliminary characterization of the optical system and calibration using dark helix light distributions before actual measurement. The Bayesian reconstruction algorithms are pre-configured with appropriate priors and parameters based on the specific imaging conditions. This preliminary action reduces the computational burden during actual data acquisition and processing, thereby improving diagnostic speed without sacrificing measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides high-accuracy spatial and temporal resolution of biological samples, reduces the need for biopsies, and shortens diagnostic wait times by overcoming the limitations of existing superresolution methods, offering a more sophisticated and efficient approach to microscopy.
Implementation Method 1
achromatic projection by a laser whereof the wavelength is aligned to the excitation wavelength of said at least one re-emitting source to create either a compact light distribution or a sequence of compact light distributions of different topology
Implementation Method 2
the sample comprising at least one re-emitting source, excited by light and re-emitting light according to a law determined as a function of light projected on the sample
Implementation Method 3
detection of the light re-emitted by said at least one re-emitting source of the sample
Data Source
AI summary
An optical measuring process for determining a longitudinal position of a set of re-emitting sources on a sample includes: (i) projecting an excitation light distribution onto the sample so as to cause the set of sources on the sample to re-emit light in a dark helix light pattern having two nulls spatially separated by a boundary an axis connecting the two nulls; and (ii) determining the longitudinal position of the set of re-emitting sources by measuring an angular position of the axis.