Data Acquisition Chip Test System Noise Calculation
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Solution Overview
Problem
Current fingerprint identification chip testing systems face inefficiencies and increased costs due to serial data transmission and inaccurate noise level detection, affecting the stability and accuracy of fingerprint identification.
Innovation Solution
A test device for a data collecting chip that includes a data collecting module, storing module, processing module, and data transceiving module, capable of calculating noise variance and bulge values to determine noise test results, reducing data transmission time and improving test reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If serial transmission mode is used between ATE and PC, then data transmission is simple to implement, but data transmission time increases greatly when data amount is large
Solution Approach 1:
The patent divides the data processing function into two parts: noise calculation is performed locally on the ATE for each pixel point, while only the final test results need to be transmitted to the PC. This segmentation of processing functions reduces the volume of transmitted data from raw pixel data to compact test results, significantly reducing transmission time while maintaining implementation simplicity
Solution Approach 2:
The patent introduces an intermediary processing function on the ATE side that performs noise calculation locally before data transmission. This intermediary processing step transforms the data format and reduces data volume, acting as a mediator between data collection and final result transmission, thereby reducing transmission time without complicating the overall system architecture
2Device complexity
If only variance calculation mode is used for noise calculation, then the calculation process is simple, but the noise level of pixel points cannot be reflected accurately when Jit noise appears
Solution Approach 1:
The patent merges two noise detection indicators (variance and Jit value) into a comprehensive noise assessment system. By calculating both variance for general noise detection and Jit value for specific noise patterns, the system achieves accurate noise level detection while keeping the calculation process relatively simple through the use of established statistical formulas
Solution Approach 2:
The patent changes the noise detection parameters from using only variance to using both variance and Jit value. This parameter change enables the system to accurately detect different types of noise (general noise via variance, Jit noise via Jit value) while maintaining computational efficiency through standard statistical calculations
3Productivity
If multiple chips are tested simultaneously to improve test efficiency, then productivity increases, but test cost increases greatly due to data transmission requirements
Solution Approach 1:
The patent segments the noise calculation operation to be performed independently on the ATE for each chip being tested simultaneously. This allows parallel processing of multiple chips while keeping data transmission minimal (only final results need transmission), thereby maintaining high productivity without proportionally increasing test costs
Solution Approach 2:
Each chip's data is processed independently on the ATE side through self-contained noise calculation operations. This self-service processing approach allows multiple chips to be tested in parallel without requiring centralized data collection and processing, reducing the overhead costs associated with simultaneous multi-chip testing
Data Source
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AI summary
A test device of a data collecting chip (10) and control method thereof, and the test device (10) includes: a data collecting module (200) for receiving multiple frames of sampling data sampling data collected by the data collecting chip; a storing module (300) ; a processing module (400) for calculating noise of a plurality of data sampling points to obtain a noise test result; a data transceiving module (500) for uploading the noise test result; and a control module (600) . The test device (10) only uploads the noise test result by calculating the noise of the plurality of data sampling points, so that the efficiency of a chip test is improved, the cost of the chip test is reduced, and the test reliability is ensured better.