Detachable Daughter Unit Shielding for High-Frequency Test Systems
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Solution Overview
Problem
Existing test systems for high-frequency devices, such as those used in high-speed wireless communication, face challenges in accurately testing these devices due to the inability to effectively cut off external electromagnetic noise, which affects testing accuracy.
Innovation Solution
A test system that includes a test head, a performance board, and a detachable daughter unit with a socket, daughter board, and enclosure that incorporates a shield to block external noise, ensuring accurate signal transmission and reception.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a performance board is used to convey test signals, then the test system can mount semiconductors of a plurality of kinds to a common board, but electromagnetic noise from outside cannot be cut off
Solution Approach 1:
The test system is divided into a performance board and a separate daughter unit. The daughter unit is detachably mounted to the performance board and contains the device under test in an isolated enclosure. This segmentation allows the performance board to maintain its versatility for mounting multiple semiconductors while the daughter unit provides electromagnetic shielding for the specific device being tested.
Solution Approach 2:
The daughter unit acts as an intermediary between the performance board and the device under test. It includes an enclosure with a shield that cuts off electromagnetic noise from outside while still allowing the test signal to be conveyed from the performance board to the device under test through controlled interfaces.
2Ease of operation
If a relay board is used between the performance board and the device under test, then signal relay functionality is provided, but electromagnetic noise from outside cannot be cut off
Solution Approach 1:
The relay functionality is integrated into the daughter unit rather than being a separate relay board. The daughter unit contains both the signal relay components and the electromagnetic shield, combining these functions into a single integrated module that can be detachably mounted to the performance board.
Solution Approach 2:
The daughter unit merges the relay board functionality with the shielding enclosure into a single integrated component. This combination allows the signal relay function to be performed while simultaneously providing electromagnetic noise cancellation for the device under test.
3Productivity
If the device under test is mounted on the performance board, then testing can be performed, but electromagnetic noise incident from outside cannot be cut off
Solution Approach 1:
The device under test is mounted on the daughter unit rather than directly on the performance board. The daughter unit is detachably mounted to the performance board, creating a separate testing chamber that isolates the device from external electromagnetic noise while maintaining testing functionality.
Solution Approach 2:
The daughter unit serves as an intermediary mounting platform between the performance board and the device under test. It provides a shielded environment for the device while still enabling signal transmission from the performance board, thus mediating between testing capability and noise isolation requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively cuts off external electromagnetic noise, enabling precise testing of high-frequency devices by isolating the device under test, thereby improving testing accuracy and reducing noise interference.
Implementation Method 1
an enclosure that accommodates therein the socket and the daughter board, and includes a daughter-unit shield that cuts off noise from outside with respect to the socket and the daughter board
Data Source
AI summary
Provided is a test system that tests a device under test, the test system including: a test head that includes a test module that generates a test signal to be supplied to the device under test; a performance board that is mounted above the test head and conveys the test signal generated by the test module; and a daughter unit that is detachably mounted to the performance board, and conveys the test signal from the performance board to the device under test, where the daughter unit includes: a socket to which the device under test is mounted; a daughter board to which the socket is mounted; and an enclosure that accommodates therein the socket and the daughter board, and includes a daughter-unit shield that cuts off noise from outside with respect to the socket and the daughter board.


