DC-DC Converter Diagnostic System Using Multi-Bank ADC Sampling
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Solution Overview
Problem
Current diagnostic systems for DC-DC voltage converters lack effective methods to accurately determine fault conditions in high voltage bi-directional MOSFET switches, leading to potential operational failures and inefficiencies.
Innovation Solution
A diagnostic system utilizing a microcontroller with an analog-to-digital converter featuring multiple banks of channels, where common and non-common channels sample voltages at different nodes of the MOSFET switch to identify voltage deviations and set fault flags, allowing for precise fault detection and control signal adjustments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single channel is used to sample voltage in the analog-to-digital converter, then the device complexity is reduced, but the diagnostic precision and fault detection capability deteriorate
Solution Approach 1:
The analog-to-digital converter is segmented into multiple independent channel banks (first bank and second bank), each capable of sampling voltage through different paths. This segmentation allows simultaneous multi-point voltage monitoring without requiring a single complex channel, thereby improving diagnostic precision while keeping individual channel structures relatively simple.
Solution Approach 2:
Each channel bank is designed with universal functionality to sample voltage from multiple nodes (first node and second node of the high voltage bi-directional MOSFET switch). The common channel and non-common channel configuration enables the same hardware structure to serve multiple diagnostic purposes, enhancing measurement precision without proportionally increasing overall device complexity.
2Reliability
If multiple banks of channels are used in the analog-to-digital converter to sample voltage at different nodes, then the fault detection capability is improved, but the device complexity increases
Solution Approach 1:
The analog-to-digital converter is divided into multiple independent channel banks (first bank and second bank), each capable of sampling voltage through different paths. This segmentation allows simultaneous multi-point voltage monitoring without requiring a single complex channel, thereby improving diagnostic precision while keeping individual channel structures relatively simple.
Solution Approach 2:
The patent implements a redundant channel structure where the second bank of channels provides a copied or alternative sampling path for voltage measurement. This copying approach enhances reliability by providing backup measurement paths and diagnostic diversity, while the copied structure follows the same design patterns, preventing exponential complexity growth.
3Loss of information
If voltage sampling is performed at multiple nodes using common and non-common channels, then the diagnostic diversity is enhanced, but the ease of operation deteriorates
Solution Approach 1:
The microcontroller automatically processes voltage samples from multiple channels and nodes, applying diagnostic algorithms to determine fault conditions. This feedback mechanism handles the complexity of multi-channel data analysis, allowing comprehensive diagnostic information collection while maintaining ease of operation through automated processing and interpretation.
Solution Approach 2:
The diagnostic system performs self-diagnosis by automatically sampling voltages across multiple nodes through different channel banks and interpreting the results. The system serves itself by internally processing the complex multi-point measurements and generating diagnostic conclusions, thereby enhancing diagnostic information completeness without requiring complex external operation.
Data Source
AI summary
A diagnostic system for a DC-DC voltage converter is provided. The DC-DC voltage converter has a high voltage bi-directional MOSFET switch. The high voltage bi-directional MOSFET switch has a first node and a second node. The microcontroller samples a first voltage at the first node at a first sampling rate utilizing a first common channel in a first bank of channels to obtain a first predetermined number of voltage samples. The microcontroller determines a first number of voltage samples in the first predetermined number of voltage samples in which the first voltage is less than a first threshold voltage. The microcontroller sets a first voltage diagnostic flag equal to a first fault value if the first number of voltage samples is greater than a first threshold number of voltage samples indicating a voltage out of range low fault condition for the analog-to-digital converter.