Automated DC Voltage Generation for Chip Testing
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Solution Overview
Problem
The manual adjustment of supply voltage for chip testing in integrated circuits is labor-intensive and time-consuming, reducing the efficiency of wafer testing.
Innovation Solution
A test method and system that utilize a processor and filter circuit to generate and filter test pulse signals, converting them into accurate DC voltages for chips via DC-DC converters, allowing for automated and precise voltage supply to improve testing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual adjustment of supply voltage is used for chip testing, then the testing process can be performed, but the testing efficiency is reduced and labor intensity increases
Solution Approach 1:
The system enables automated voltage adjustment where the processor automatically generates test pulse signals, the filter circuit converts them to DC voltages, and the DC-DC converter adjusts the voltage levels without manual intervention. This self-service automation eliminates manual labor while maintaining testing functionality, directly resolving the contradiction between productivity and ease of operation
Solution Approach 2:
The patent replaces manual mechanical voltage adjustment with an electronic automated system consisting of a processor, filter circuit, and DC-DC converter. This substitution of mechanical/manual operations with electronic automation increases testing efficiency while reducing labor intensity, addressing the technical contradiction
2Loss of time
If manual voltage adjustment is used, then the testing can be performed, but the testing time increases
Solution Approach 1:
The system performs preliminary automated setup by pre-configuring the processor to generate appropriate test pulse signals and pre-establishing the filter circuit and DC-DC converter pathways. This preliminary automation eliminates time-consuming manual adjustments during actual testing, reducing total testing time while increasing automation level
Solution Approach 2:
The automated system maintains continuous operation where the processor continuously generates test signals, the filter circuit continuously converts them to DC voltages, and the DC-DC converter continuously adjusts voltage levels. This continuous automated action eliminates interruptions and manual intervention delays, reducing testing time while enhancing automation
3Productivity
If automated DC voltage generation is implemented, then testing efficiency improves, but the system complexity increases
Solution Approach 1:
The processor serves multiple functions: generating test pulse signals, controlling the filter circuit, and managing the DC-DC converter operations. This multi-functionality consolidates what could be separate complex components into a single versatile unit, improving testing efficiency while limiting the increase in overall system complexity
Solution Approach 2:
The filter circuit acts as an intermediary component that simplifies the system architecture by converting test pulse signals to DC voltages before they reach the DC-DC converter. This intermediary function creates a clear signal flow and separates concerns, making the automated system easier to manage and understand despite increased complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the accuracy and efficiency of chip testing by enabling precise control over DC voltages, reducing manual labor and increasing the speed of the testing process.
Implementation Method 1
filtering the test pulse signal to generate a first test DC voltage
Implementation Method 2
the DC-DC converter converts the first test DC voltage into a second test DC voltage
Data Source
AI summary
A test method is configured to test a chip on a circuit under test, wherein the circuit under test further includes a DC-DC converter. The test method includes the operations of: generating a test pulse signal; filtering the test pulse signal to generate a first test DC voltage to the DC-DC converter, wherein the DC-DC converter transforms the first test DC voltage to a second test DC voltage and transmits the second test DC voltage to the chip; and extracting an output signal of the chip to determine a performance of the chip, wherein the chip generates the output signal according to the second test DC voltage.