DCI Module Segmentation for IC I/O Testing

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Solution Overview

Problem

The challenge lies in effectively testing advanced integrated circuits (ICs) with numerous input/output (I/O) terminals, as existing automated test equipment (ATE) often lacks the necessary I/O channels and resources, leading to sub-optimal testing environments or costly upgrades.

Innovation Solution

The method involves using a plurality of digitally controlled impedance (DCI) modules to configure impedances of I/O terminals, with a control module operating in a test mode to selectively enable each DCI module, allowing for efficient testing of termination impedances using fewer ATE resources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If ATE equipment is upgraded to test ICs with hundreds of I/O terminals, then testing capability is improved, but equipment cost increases

Engineering Contradiction:

Improvetesting capabilityVSAvoidequipment cost

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent segments the I/O terminals into multiple groups, with each group served by a separate DCI module. This allows the test system to control and test one group at a time, reducing the number of simultaneous I/O channels needed from hundreds to a manageable number, thereby avoiding expensive ATE upgrades.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent introduces DCI modules as intermediary components between the test system and the I/O terminals. These modules act as mediators that translate control signals into impedance configurations for specific I/O groups, enabling the test system to manage complex ICs with limited ATE resources.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Measurement precision

If multiple DCI modules are used to configure I/O terminal impedances, then testing accuracy is improved, but control complexity increases

Engineering Contradiction:

Improveimpedance testing accuracyVSAvoidcontrol complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the control of multiple DCI modules into segmented groups, where each module controls a specific subset of I/O terminals. This segmentation allows the control system to manage each module independently, reducing overall control complexity while maintaining precise impedance configuration for each group.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent implements dynamic control where the test system can selectively enable and disable different DCI modules based on the current test requirements. This dynamic activation allows the system to adapt the number of active modules, optimizing the balance between testing accuracy and control complexity for different IC configurations.

Inventive Principle:

Principle #15Dynamics

Data Source

PatentUS8065570B1Testing an integrated circuit having configurable input/output terminals

Publication Date: 2011.11.22 XILINX INC

AI summary

Testing an integrated circuit (IC) having numerous terminals coupled to numerous digitally controlled impedance (DCI) modules, where the numerous DCI modules control configurable impedances of the numerous terminals. The IC further includes a control circuit having outputs coupled to enable inputs of the numerous DCI modules, where operating the IC in a test mode configures the control circuit to selectively couple a control signal to the enable terminals of the numerous DCI modules. One DCI module of the numerous DCI modules can be enabled at a time facilitating testing of the configurable impedances of the I/O terminals.