Dodecacarbonyl Triruthenium Purification via Low-Oxygen Recrystallization

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Solution Overview

Problem

Ruthenium thin films formed by chemical vapor deposition using dodecacarbonyl triruthenium (DCR) purified by sublimation methods can be contaminated with impurities, and conventional recrystallization methods may introduce gray substances during the purification process.

Innovation Solution

A recrystallization method is optimized by maintaining a dissolved oxygen concentration of 0.2 mg/L or less in the solvent during the dissolution stage, which effectively separates trace impurities and prevents the formation of gray substances, ensuring high-purity DCR for chemical vapor deposition.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a sublimation method is used to purify DCR, then low-sublimability elements such as Fe can be separated, but the formed ruthenium film is sometimes contaminated with a small amount of impurities

Engineering Contradiction:
Improvepurity of DCRVSAvoidcontamination of thin film with impurities
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The patent applies an inert atmosphere (nitrogen or argon gas) during the recrystallization process to prevent oxidation of DCR and formation of gray substances. The inert gas replaces air in the reaction system, creating an oxygen-free environment that eliminates harmful oxidation reactions while allowing effective purification through controlled recrystallization.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The patent changes the dissolved oxygen concentration parameter to 0.2 mg/L or less during the dissolution stage of recrystallization. This precise parameter control prevents formation of gray substances while enabling effective separation of trace impurities, resolving the contradiction between purification effectiveness and film contamination prevention.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If a conventional recrystallization method is used to purify DCR, then trace impurities can be removed, but gray substances are formed during the purification process

Engineering Contradiction:
Improvepurity of DCRVSAvoidformation of gray substances
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent introduces an inert atmosphere (nitrogen or argon) during recrystallization to prevent oxidation reactions that form gray substances. The inert gas environment eliminates oxygen from the system, preventing the formation of harmful gray by-products while maintaining the purification effectiveness of the recrystallization process.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The patent严格控制 the dissolved oxygen concentration to 0.2 mg/L or less during the dissolution stage. This precise parameter control prevents oxidation and gray substance formation while enabling effective trace impurity removal, resolving the contradiction between purification and harmful by-product formation.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If DCR is used in an unpurified state for thin film formation, then the purification process is simplified, but ignition may occur upon opening the material container due to impurity elements such as Fe, Al, and Cr

Engineering Contradiction:
Improvesimplicity of purification processVSAvoidsafety of thin film formation process
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent extracts harmful impurity elements (Fe, Al, Cr) from DCR through a simplified recrystallization process performed in an inert atmosphere. This selective extraction removes ignition-causing impurities while maintaining process simplicity, resolving the contradiction between manufacturing ease and process safety.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent uses an inert atmosphere during recrystallization to safely handle and purify DCR containing reactive impurities. The inert environment prevents unwanted reactions during purification while enabling effective removal of harmful elements, ensuring both simplicity and safety.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method achieves impurity separation even at trace levels, preventing contamination in the formed ruthenium thin films and suppressing the formation of gray substances, thereby ensuring high film purity and stability.

Implementation Method 1

use of the difference in solubility in a predetermined solvent between DCR and impurities

Methodology Applied
Scientific EffectSolubility: Solvation

Implementation Method 2

a precipitation stage of precipitating DCR from the solvent

Methodology Applied
Scientific EffectPrecipitation: Precipitation

Data Source

PatentUS9783429B2Method for purifying dodecacarbonyl triruthenium
Publication Date: 2017.10.10 TANAKA KIKINZOKU KOGYO KK
  • US9783429B2 patent drawing
  • US9783429B2 patent drawing
  • US9783429B2 patent drawing

AI summary

An object of the present invention is to provide a purification method to give dodecacarbonyl triruthenium (DCR) which serves as a raw material for chemical vapor deposition and does not cause the contamination of a thin film with impurities even when used to form a ruthenium thin film. The present invention relates to a method in which the dissolved oxygen concentration in the solvent is made 0.2 mg/L or less in at least a dissolution stage, and an organic ruthenium compound including DCR as a raw material for chemical vapor deposition is purified by a recrystallization method. The present invention allows a trace amount of impurities to be separated from DCR. When a ruthenium thin film is formed by use of DCR thus obtained, the formed film is hardly contaminated with impurities. Additionally, the purification method of the present invention is also applicable for recovering/purifying DCR after being used for the formation of a ruthenium thin film.