DDEBA Photodetector Low Voltage Operation

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Solution Overview

Problem

Current imagers and photodetectors, such as silicon-based and MCP-based systems, face challenges in being solar-blind, having low quantum efficiency, limited resolution, high voltage requirements, and fabrication difficulties, which hinder their effectiveness in interplanetary applications and low-light imaging.

Innovation Solution

The development of Delta-doped Electron Bombarded Arrays (DDEBAs) that utilize a thinned, delta-doped imager array and a high-efficiency, stable photocathode, eliminating the need for high voltage and microchannel plates, and incorporating III-Nitride materials for improved low-energy electron detection and reduced complexity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If MCP-based detectors are used, then electron signal gain is achieved, but high voltage requirements and device complexity increase

Engineering Contradiction:
Improveelectron signal gainVSAvoidhigh voltage requirements
Core Design Contradiction:
PowerVSDevice complexity

Solution Approach 1:

The patent extracts and eliminates the MCP component from the detector system, replacing it with a direct electron bombardment approach onto a semiconductor substrate. This removes the need for high voltage acceleration fields and complex vacuum tube structures while maintaining electron gain functionality through direct electron-hole pair generation in the semiconductor material.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the mechanical/electrical MCP amplification system with a semiconductor-based electronic detection system. Instead of using physical electron multiplication through MCP channels, the invention uses direct electron bombardment to generate electrical signals in a semiconductor detector, substituting a complex electromechanical system with a simpler solid-state electronic system.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Area of stationary object

If conventional silicon sensors are used, then large format and low noise are achieved, but solar-blind UV detection capability is lost

Engineering Contradiction:
Improvedetector format sizeVSAvoidsolar-blind UV detection
Core Design Contradiction:
Area of stationary objectVSAdaptability or versatility

Solution Approach 1:

The patent employs composite material structures, specifically combining semiconductor materials with appropriate bandgaps (such as GaN, SiC, or diamond) with silicon sensor technologies. This composite approach enables the detector to maintain the large format and low noise characteristics of silicon sensors while adding solar-blind UV detection capability through the wide bandgap material properties that naturally reject visible light.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent applies local quality by creating regions with different material properties within the detector structure. Specific areas or layers are designed with wide bandgap materials for UV detection while other regions maintain silicon properties for visible light sensitivity, allowing the same detector to perform different functions in different spatial zones or spectral bands.

Inventive Principle:
Principle #3Local quality

3Adaptability or versatility

If new wide bandgap materials are used, then solar-blind UV detection is achieved, but manufacturing complexity and fabrication difficulty increase

Engineering Contradiction:
Improvesolar-blind UV detectionVSAvoidfabrication difficulty
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The patent segments the detector into separate functional components that can be manufactured independently using different material systems. By dividing the detector into a photocathode section (for UV detection) and a readout section (using mature silicon CMOS or CCD technology), the invention allows each segment to be optimized and manufactured separately, reducing overall fabrication complexity while maintaining advanced UV detection capabilities.

Inventive Principle:
Principle #1Segmentation

4Power

If MCP-based imagers are used, then electron multiplication is achieved, but resolution and quantum efficiency are limited

Engineering Contradiction:
Improveelectron multiplicationVSAvoidresolution
Core Design Contradiction:
PowerVSMeasurement precision

Solution Approach 1:

The patent replaces the mechanical electron multiplication process in MCPs with a direct electron bombardment mechanism onto a high-resolution semiconductor detector. This substitution eliminates the resolution-limiting factors of MCP channel structures and vacuum tube geometry, allowing direct coupling of electron signal generation with high-precision semiconductor detection to achieve superior spatial resolution.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

DDEBAs achieve high quantum efficiency, compactness, low power consumption, and robustness, enabling efficient low-light imaging and photon counting with reduced size, mass, and cost, while being radiation tolerant and capable of operating at lower voltages.

Implementation Method 1

MCP-based detectors use a solar-blind photocathode that absorbs photons (UV, visible or near-IR) and ejects the photoelectrons into the vacuum

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

said electric field being designed to accelerate said at least one electron across said accelerating gap to impinge on said imager array

Methodology Applied
Scientific EffectElectric field acceleration: Electric Field

Data Source

PatentUS8558234B2Low voltage low light imager and photodetector
Publication Date: 2013.10.15 CALIFORNIA INST OF TECH
  • US8558234B2 patent drawing
  • US8558234B2 patent drawing
  • US8558234B2 patent drawing

AI summary

Highly efficient, low energy, low light level imagers and photodetectors are provided. In particular, a novel class of Della-Doped Electron Bombarded Array (DDEBA) photodetectors that will reduce the size, mass, power, complexity, and cost of conventional imaging systems while improving performance by using a thinned imager that is capable of detecting low-energy electrons, has high gain, and is of low noise.