Configurable Phase Range for DDR Burst Detection

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Solution Overview

Problem

Conventional methods for separating read and write bursts in DDR signals are not robust and can produce incorrect results due to variations in phase difference between data and strobe signals, especially on problematic DUTs, leading to data corruption and system errors.

Innovation Solution

A method that allows users to configure a range of phase difference values for read and write bursts, averages the phase values, and compares them to a pre-configured phase range to accurately identify burst types, enhancing the reliability and accuracy of DDR signal processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional phase difference methods are used to separate read and write bursts, then the separation method is simple, but the reliability and accuracy deteriorate on problematic DUTs due to phase variations

Engineering Contradiction:
Improveburst separation reliabilityVSAvoidphase analysis complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-configuring phase ranges for read and write bursts before actual signal analysis. The system establishes expected phase difference ranges (e.g., 0° for read, 90° for write) in advance, then compares actual measured phases against these pre-set ranges to identify burst types, improving reliability without requiring complex real-time analysis

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the parameter approach from using fixed phase difference values to using configurable phase ranges. Instead of checking if phase difference equals exactly 0° or 90°, the system defines acceptable ranges that account for variations in problematic DUTs, thereby improving measurement accuracy and reliability while maintaining straightforward implementation

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If fixed phase difference values are used for burst identification, then the method is straightforward, but measurement precision deteriorates due to phase variations between DUTs and edges

Engineering Contradiction:
Improvephase difference measurement precisionVSAvoidconfiguration complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent applies dynamics by making phase difference values configurable rather than fixed. The system allows users to define phase ranges dynamically based on specific DUT characteristics and operating conditions. This enables the measurement system to adapt to different devices and scenarios, improving precision while maintaining ease of operation through a user-friendly configuration interface

Inventive Principle:
Principle #15Dynamics

3Reliability

If phase difference between data and strobe signals is used to separate bursts, then the separation approach is simple, but correctness deteriorates leading to data corruption and system errors

Engineering Contradiction:
Improvedata transfer reliabilityVSAvoidphase detection difficulty
Core Design Contradiction:
ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent applies feedback by comparing measured phase differences against pre-configured expected ranges and using this comparison to correctly identify burst types. The system continuously monitors phase differences, compares them with stored reference ranges, and uses this feedback to accurately distinguish between read and write bursts, preventing data corruption while maintaining simple detection methodology

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS12254935B2Use of configurable phase range to detect DDR read and write bursts
Publication Date: 2025.03.18 ROHDE & SCHWARZ GMBH & CO KG
  • US12254935B2 patent drawing
  • US12254935B2 patent drawing
  • US12254935B2 patent drawing

AI summary

A method (and corresponding system, computer program and storage device) for testing a device under test, DUT, comprising: generating or receiving, by a component of the DUT, a bus signal, wherein the bus signal comprises a first data signal having a plurality of first phase angles or a second data signal having a plurality of second phase angles; averaging the phase angles for a predetermined bus signal length; comparing the averaged phase angle with a preset phase range; and identifying the first data signal or the second data signal in the bus signal based on the comparison.