DDR6 Memory Die Protection Using SECDED and Reed-Solomon

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Solution Overview

Problem

Existing DDR6 memory systems face challenges in protecting data due to the limitations of traditional on-die single error correction (SEC) methods, which require additional bits per die, and fail to provide comprehensive protection against die failures and simultaneous errors across multiple dies.

Innovation Solution

Implementing a combination of Single Error Correction/Double Error Detection (SECDED) encoding and Reed-Solomon encoding to utilize the available forty additional bits for data protection, forming encoded symbol groups and generating RS parities to protect the sixty-four bits of data, with a portion of these bits reserved for metadata storage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional on-die SEC protection is used for each die, then individual die protection is provided, but seventy bits are needed while only forty bits are available

Engineering Contradiction:
Improvedata protectionVSAvoidbits required
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent combines data from multiple dies into encoded symbol groups and applies unified error correction coding across the group. Instead of protecting each die separately with individual SEC codes requiring 7 bits per die, the invention merges data from 10 dies into groups and applies a collective coding scheme that uses only 40 bits total, achieving both individual die protection and staying within the bit budget constraint.

Inventive Principle:
Principle #5Merging (Combining)

2Quantity of substance

If data from multiple dies is combined for SEC protection, then the forty available bits can be used, but protection against simultaneous die failure and random errors on other dies is not provided

Engineering Contradiction:
Improvebits usedVSAvoidcomprehensive error protection
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent employs a composite error correction approach that integrates two distinct coding schemes: SECDED encoding for correcting single random errors within encoded symbols, and Reed-Solomon encoding for detecting and handling die failures. This composite structure allows the system to simultaneously protect against both types of errors using the available 40 bits, achieving comprehensive protection that neither coding scheme could provide alone.

Inventive Principle:
Principle #40Composite materials

3Reliability

If encoded symbol groups are formed with RS parities, then data integrity is ensured against die failures, but device complexity increases

Engineering Contradiction:
Improvedata integrityVSAvoidencoding structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the data from 10 dies into two separate encoded symbol groups, with each group containing data from specific dies and having its own RS parity bits. This segmentation allows the error correction process to be applied independently to each group, simplifying the overall system architecture while maintaining comprehensive protection. The segmentation also enables more efficient error localization and correction compared to a single large encoded group.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20260050513A1System and Method for Protecting Data
Publication Date: 2026.02.19 MICROSOFT TECHNOLOGY LICENSING LLC
  • US20260050513A1 patent drawing
  • US20260050513A1 patent drawing
  • US20260050513A1 patent drawing

AI summary

A method, computer program product, and computing system for defining one or more encoded symbols for data included within each of a plurality of memory dies of a memory module to define one or more groups of encoded symbols; generating Reed-Solomon parities for each group of encoded symbols; and recovering one or more portions of the data included within each of the plurality of memory dies of the memory module in the event of data corruption or die failure using one or more of the encoded symbols and the Reed-Solomon parities.