Debug Probe Multi-Function Measurement via Analog Signal Detection
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Solution Overview
Problem
Debug probes are not typically used for measuring analogue quantities such as current, power, or voltage, as they are designed for digital signal exchange, and adding extra pins for analogue signals is difficult due to standardization requirements.
Innovation Solution
A debug probe with an interface comprising a plurality of pins, including debug control circuitry for controlling debugging based on digitally sampled signals and measurement circuitry for measuring properties of a target system based on analogue levels of signals received through the same pins.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a debug probe uses only digital signal exchange through standardized pins, then compatibility with standard debug interfaces is maintained, but the ability to measure analogue quantities such as current, power, or voltage is lost
Solution Approach 1:
The debug probe is designed to perform multiple functions using the same physical pins. The measurement circuitry enables the probe to measure analogue quantities (current, power, voltage) through pins that are already connected for digital debugging purposes. This multi-functionality allows a single probe to serve both debugging and measurement roles without requiring additional pins or interface modifications.
Solution Approach 2:
The patent changes the parameter being measured from digital logic levels to analogue electrical quantities. By configuring the measurement circuitry to detect analogue voltage levels on existing digital pins, the probe can derive current and power information from voltage measurements. This parameter transformation enables measurement capability without adding physical interface complexity.
2Adaptability or versatility
If extra pins are added to the debug probe for analogue signal input, then measurement capability is improved, but backwards compatibility with standard debug interfaces is lost
Solution Approach 1:
The existing debug probe pins are made universal by enabling them to serve both their original digital debugging function and a new measurement function. The measurement circuitry is designed to work with the voltage levels already present on the standard interface pins during normal operation, allowing the same pins to be used for both purposes simultaneously or alternately without requiring any physical modifications to the interface.
3Measurement precision
If separate probes are used for debugging and measurement, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent merges the debugging probe and measurement probe into a single integrated device. The measurement circuitry is incorporated directly into the debug probe, allowing both debugging control and analogue measurement functions to be performed by one tool. This consolidation reduces system complexity while maintaining measurement capability through clever use of the existing interface infrastructure.
Data Source
AI summary
A debug probe (102) for controlling debugging of a target system (104) is described, the debug probe comprising an interface (128) comprising a plurality of pins (202), debug control circuitry (130) to control debugging of the target system based on a digitally sampled level of at least one signal communicated through at least one of the plurality of pins, and measurement circuitry (204) to make a measurement of a property of the target system based on an analogue level of a signal received through said at least one of the plurality of pins.