Debug Trace Circuit for Semiconductor Event Observation
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Solution Overview
Problem
Existing semiconductor integrated circuit tracing systems are limited by communication line speed and internal buffer capacity, restricting the observation of high-speed internal operations and inability to observe all relevant signals simultaneously.
Innovation Solution
A semiconductor integrated circuit with a debug/trace circuit that uses a control information list to continuously generate and observe events, allowing for the detection of target events and execution of designated operations based on predefined conditions, independent of communication line speed and buffer capacity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If trace data is output to the outside of the LSI using communication lines, then the tracing system can observe operations, but the observation speed is limited by communication line speed and internal buffer capacity
Solution Approach 1:
The patent extracts only the necessary trace information from the internal operations and outputs it selectively through monitoring terminals, rather than outputting all trace data. This is achieved through signal selection circuits that filter and prioritize specific signals for output, reducing the data volume limited by communication lines while maintaining observation capability for critical operations.
Solution Approach 2:
The patent introduces monitoring terminals as intermediary points between the internal circuit operations and the external observation system. These terminals provide dedicated observation points that can capture high-speed internal operations without being constrained by general-purpose communication line speeds, acting as a buffer layer that preserves high-speed trace data locally while allowing selective external access.
2Loss of information
If multiple signals are monitored simultaneously to capture complete operational behavior, then the tracing comprehensiveness is improved, but the device complexity and resource consumption increase
Solution Approach 1:
The patent creates monitoring terminals that serve multiple functions: they can monitor different signals at different times, support various observation modes (real-time, historical, conditional), and adapt to different debugging needs. This multi-functional design allows comprehensive signal monitoring capability without proportionally increasing circuit complexity, as the same terminal infrastructure supports diverse tracing requirements.
Solution Approach 2:
The patent implements dynamic signal selection where the set of monitored signals can be changed during operation based on debugging needs. Signal selection circuits allow dynamic reconfiguration of which signals are routed to monitoring terminals, enabling the system to adapt its monitoring scope without physical reconfiguration, thus maintaining comprehensiveness while managing complexity through software-controlled dynamic allocation.
Data Source
AI summary
A main functional structure executes continuous predetermined operations to continuously generate events associated with the operations. A debug/trace circuit compares an event occurring at the main functional structure with detection condition indicating information of one entry in a control information list, and executes the operation designated by operation indicating information paired with the detection condition indicating information in accordance with the result of the comparison. The debug/trace circuit continuously performs this in accordance with the control information list to identify the event.