Decorative Material Gloss Control Layer Scratch Resistance

The patent uses optical copying instead of physical copying. A gloss control layer with continuously varying depth is formed to optically simulate three-dimensional unevenness through light reflection differences, rather than actually embossing the surface. This eliminates physical protrusions that would catch scratches and contaminants while maintaining the visual three-dimensional effect.

The patent replaces the mechanical embossing system with an optical system. Instead of using mechanical pressure to create physical unevenness, the patent uses light reflection principles where a gloss control layer with varying depth creates apparent three-dimensional effects through differences in light reflection, thereby avoiding mechanical surface deformation that compromises durability.

The patent creates an optical copy of continuous unevenness rather than a physical copy. The gloss control layer contains inorganic particles that scatter light to simulate the appearance of continuous depth variations like wood vessels, while the actual surface remains flat and resistant to scratching.

The patent changes the optical parameters of the surface rather than the physical geometry. By controlling the depth and particle distribution in the gloss control layer, the patent achieves continuous variation in light reflection that mimics natural wood vessel structures, while maintaining a flat physical surface that resists scratches.

The patent changes the particle size parameter of the inorganic material used for matting. Instead of using fine silica particles that create contamination pockets, the patent uses coarser inorganic particles with a volume median diameter of 3 μm or more. This particle size provides effective light scattering for gloss control while reducing the formation of contamination-prone micro-cavities.

The patent replaces the conventional fine particle matting agents with coarser inorganic particles that serve the same optical function but with better contamination resistance. The coarser particles create larger, fewer scattering centers that are less prone to trapping contaminants compared to fine particles.