Decoupling Circuit with Redundant Capacitor Switching for Reliability

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Solution Overview

Problem

The increasing integration density and operating speed of semiconductor devices lead to significant power noise issues, which conventional decoupling capacitors struggle to manage effectively, often compromising reliability due to voltage differences and reduced capacitance when using multi-stage capacitors.

Innovation Solution

A decoupling circuit design that includes a first capacitor with a switch device and control device, which can be dynamically turned on or off based on voltage levels, and a second capacitor that operates as a redundant unit when the first capacitor experiences time-dependent dielectric breakdown, maintaining capacitance and reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If a 1-stage cell type capacitor is used to maximize capacitance per unit area, then the capacitance is maximized, but the reliability is lowered due to increased voltage difference applied to the capacitor

Engineering Contradiction:
ImprovecapacitanceVSAvoidreliability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The decoupling capacitor is divided into multiple stages (first cell type capacitor and second capacitor) connected in series. This segmentation reduces the voltage difference across each individual capacitor, improving reliability while maintaining adequate total capacitance for noise reduction.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces dynamic control mechanisms including switch devices and control circuits that can adjust the operation state of capacitors based on voltage levels and operational conditions. This allows the system to adaptively manage voltage distribution and capacitor usage to optimize both reliability and capacitance performance.

Inventive Principle:
Principle #15Dynamics

2Reliability

If a multi-stage cell type capacitor is used to enhance reliability, then the reliability is improved, but the overall capacitance is reduced

Engineering Contradiction:
ImprovereliabilityVSAvoidcapacitance
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent combines multiple capacitor types (first cell type capacitor and second capacitor) in a hybrid configuration. The second capacitor is specifically designed to compensate for the capacitance reduction in the first capacitor, ensuring that the overall decoupling circuit maintains sufficient total capacitance while benefiting from the reliability improvements of multi-stage design.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent modifies physical parameters including the dielectric material properties and structural dimensions of the second capacitor to optimize its capacitance value. By adjusting these parameters, the second capacitor provides adequate capacitance compensation to maintain overall decoupling performance despite the voltage-splitting effect of multi-stage configuration.

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If the area of decoupling devices is increased to reduce power noise, then the power noise is reduced, but the area occupied on the chip is continuously increased

Engineering Contradiction:
Improvepower noiseVSAvoidarea
Core Design Contradiction:
Object-affected harmful factorsVSArea of stationary object

Solution Approach 1:

The patent employs composite capacitor structures combining different capacitor types with complementary characteristics. The first cell type capacitor provides high capacitance density, while the second capacitor adds reliability and capacitance compensation. This composite approach achieves effective power noise reduction without requiring proportional increases in total decoupling device area.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances the reliability of semiconductor devices by allowing the second capacitor to take over when the first experiences breakdown, maintaining capacitance and minimizing power noise while avoiding the need for separate redundancy processes.

Implementation Method 1

a first capacitor having a first end connected to a first terminal, a first switch device connected between a second end of the first capacitor and a second terminal

Methodology Applied
Scientific EffectCapacitance: Capacitance

Implementation Method 2

If a time dependent dielectric breakdown (TDDB) is generated in the first capacitor, the first control device turns off the first capacitor

Methodology Applied
Scientific EffectTime-dependent dielectric breakdown: Dielectric

Data Source

PatentUS9692424B2Decoupling circuit and semiconductor device including the same
Publication Date: 2017.06.27 SAMSUNG ELECTRONICS CO LTD
  • US9692424B2 patent drawing
  • US9692424B2 patent drawing
  • US9692424B2 patent drawing

AI summary

A decoupling circuit and a semiconductor device including the same are provided. The decoupling circuit includes a first circuit including a first capacitor having a first end connected to a first terminal, a first switch device connected between a second end of the first capacitor and a second terminal, and a first control device configured to turn on/off the first switch device based on a voltage level of the a second end of the first capacitor, and a second circuit including a second capacitor having a first end connected to the first terminal, a second switch device connected between a second end of the second capacitor and the second terminal, and a second control device configured to turn on/off the second switch device based on a voltage level of the second end of the second capacitor and an output signal of the first control device.