Deep Trench MIM Capacitor Moat Isolation

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Solution Overview

Problem

The existing deep trench moat structure in integrated circuits fails to provide effective isolation between the storage capacitor array and the support area due to the use of metal-insulator-metal (MIM) capacitor designs, where the metal at the bottom of the moat recess allows current flow, compromising isolation and increasing manufacturing costs when decoupling moat and capacitor formation.

Innovation Solution

A moat isolation structure is formed by extending it deeper into the substrate than the MIM capacitor, lined with an insulator and filled with a further insulator or conductor, allowing for common processing with MIM capacitor fabrication while preventing metal formation at the bottom of the moat, ensuring electrical isolation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If decoupling of moat formation and capacitor formation is implemented to maintain isolation, then isolation function is preserved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improveisolation functionVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the moat formation process with the MIM capacitor formation process into a single integrated sequence. Both structures are formed simultaneously using common deposition and processing steps, eliminating the need for separate decoupled processes. The metal layers are deposited across both capacitor and moat regions, then selectively removed or retained based on local requirements.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent creates a universal processing sequence that serves multiple functions: the same deposition process forms both the MIM capacitor structure in the capacitor region and the insulator lining in the moat region. This multi-functional approach allows a single process flow to achieve both capacitor fabrication and isolation structure formation without requiring separate dedicated processes.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach maintains the enhanced electrical properties of MIM capacitors while providing effective isolation between the array and support areas, reducing manufacturing complexity and costs by maximizing common processing steps with MIM capacitor fabrication.

Implementation Method 1

a moat isolation structure is formed by extending it deeper into the substrate than the MIM capacitor and is formed by an insulator lining in a trench and filled with a fill material comprising one of a further insulator and an insulator layer

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS9171848B2Deep trench MIM capacitor and moat isolation with epitaxial semiconductor wafer scheme
Publication Date: 2015.10.27 GLOBALFOUNDRIES US INC
  • US9171848B2 patent drawing
  • US9171848B2 patent drawing
  • US9171848B2 patent drawing

AI summary

An integrated circuit structure provides at least one metal-insulator-metal (MIM) capacitor and a moat isolation structure wherein the number of processes required is substantially minimized and the formation of the MIM capacitor and the moat isolation structure effectively decouple while the number of processes common to the moat isolation structure and the MIM capacitor are maximized. Additional required processes are non-critical and tolerant of overlay positioning error.