Deep-Well Semiconductor Surge Suppressor for Lightning Protection

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Solution Overview

Problem

Current programmable semiconductor surge suppressors, such as the P61089, are insufficient in anti-lightning and anti-surge performance, with a maximum protection level of around 2000 V, which can lead to damage from lightning strikes and surges in telephone communication equipment.

Innovation Solution

A programmable semiconductor surge suppressor with a deep-well structure, comprising PN junction diodes, PNPN-type thyristors, and NPN-type triodes, featuring a concave-convex PN junction interface and optimized impurity concentration gradients to enhance discharge capability, increasing the effective contact area and reducing resistivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional programmable semiconductor surge suppressor (P61089) is used, then the device provides basic surge protection with programmable voltage, but the anti-lightning performance is limited to around 2000 V

Engineering Contradiction:
Improveanti-lightning performanceVSAvoidsurge voltage damage
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent changes the physical and chemical parameters of the semiconductor structure by introducing a deep-well architecture with graded impurity concentration (P+, P, N, N+ layers) and optimized junction characteristics, thereby increasing the breakdown voltage from 2000 V to 3000-3500 V and improving anti-lightning performance

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs a composite semiconductor structure combining multiple doped layers (P-type heavy diffusion, P-type diffusion, N-type light doped, N-type heavy implanted) to create a deep-well PN junction with enhanced electrical characteristics and higher surge withstand capability

Inventive Principle:
Principle #40Composite materials

2Loss of energy

If the protection device structure is simplified, then the manufacturing cost is reduced, but the energy discharge capability is insufficient

Engineering Contradiction:
Improveenergy discharge capabilityVSAvoidsemiconductor structure complexity
Core Design Contradiction:
Loss of energyVSDevice complexity

Solution Approach 1:

The patent segments the semiconductor structure into distinct functional layers (P+ contact layer, P diffusion layer, N light doped layer, N+ substrate) with each layer serving specific purposes for charge distribution and discharge, enabling enhanced energy handling capability through structured segmentation

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality optimization by creating a deep-well structure with varying impurity concentrations at different depths and locations, where the P-type diffusion layer and N-type layers are strategically positioned to optimize electric field distribution and energy dissipation in critical regions

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The improved design achieves a higher anti-lightning performance level of 3000-3500 V, providing enhanced protection against surges and lightning strikes, with increased energy discharge capability and broader voltage endurance.

Implementation Method 1

each of the protection units being composed of a PN junction diode, a PNPN-type thyristor and a NPN-type triode

Methodology Applied
Scientific EffectPN junction effect: Diode

Implementation Method 2

based on the PNPN structure and principle

Methodology Applied
Scientific EffectPNPN structure:

Implementation Method 3

anode of the diode and cathode of the thyristor, connected with each other, act together as Port K of the protection unit

Methodology Applied
Scientific EffectSemiconductor conduction: Conduction (electrical)

Data Source

PatentUS7855399B2Protection device of programmable semiconductor surge suppressor having deep-well structure
Publication Date: 2010.12.21 SEMITEL ELECTRONICS
  • US7855399B2 patent drawing
  • US7855399B2 patent drawing
  • US7855399B2 patent drawing

AI summary

A protection device of programmable semiconductor surge suppressor having deep-well structure is provided comprising one, two or four protection units, each of which is composed of a PN-junction diode, a PNPN-type thyristor and a NPN-type triode connected with each other. It is characterized in that in the diode area on the frontal side of the N-type semiconductor base is formed a PN junction with impurity concentration changed gradiently from top to bottom according to the order of P+, P, N and N+; and a group of deep-wells with P-type impurities are positioned at the interface of the PN junction, making the PN junction form a concave-convex type interface. The present invention can be used in the program-controlled switchboard to protect the Subscriber Line Interface Circuit (SLIC) board. The above improvement can further improve the anti-lightning and anti-surge performance and the energy discharge capability of the whole device. The device of the present invention can reach a level of 3000˜3500 V according to the anti-lightning performance test.