ML Defect Classification With Outlier Filtering for Display Modules

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Solution Overview

Problem

Existing methods for identifying manufacturing defects, particularly in display panel modules, are inefficient and prone to errors due to the use of traditional mechanisms and human inspectors, which are time-consuming and prone to labeling inaccuracies, making it difficult to scale and maintain production quality.

Innovation Solution

Employing machine learning models with an outlier filter to identify and remove noisy data during training, using a tuned decision boundary to enhance the accuracy of defect detection models by filtering out unconfident data samples.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional inspection mechanisms and human inspectors are used to identify manufacturing defects, then the process is simple to implement, but the accuracy and efficiency of defect detection deteriorate due to time-consuming operations and labeling inaccuracies

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidinspection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces traditional mechanical inspection systems (human inspectors and manual examination processes) with an automated machine learning-based inspection system. The ML model automatically analyzes product images, identifies defects, and classifies them, eliminating the need for human inspectors and significantly reducing inspection time while improving accuracy and consistency.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an automated image analysis system as an intermediary between the manufactured product and the defect identification process. This intermediary system uses machine learning algorithms to process product images, extract defect features, and provide accurate defect classification, serving as a bridge that replaces direct human inspection while maintaining or improving detection quality.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If traditional inspection mechanisms are used, then the system complexity is low, but the scalability and consistency of defect detection deteriorate

Engineering Contradiction:
Improveinspection efficiencyVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent replaces manual inspection processes with an automated machine learning system that processes product images through trained models. This substitution enables high-speed, consistent defect detection across large production volumes, dramatically improving productivity while the system handles the complexity of defect classification internally through algorithmic processing rather than human cognitive effort.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If all training data is used to train defect detection models, then the training process is simple, but the model accuracy deteriorates due to noisy labels and unconfident data samples

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidtraining process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts and removes noisy, unconfident data samples from the training dataset before model training. By identifying and excluding data samples with unreliable labels or low confidence scores, the system trains the defect detection model only on high-quality, confident data, thereby improving model accuracy and generalization performance while reducing the negative impact of contaminated training data.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent performs preliminary data filtering and quality assessment before the actual model training process. By pre-processing the training data to identify and remove noisy samples, the system prepares a cleaner, higher-quality dataset for training, which leads to better model performance without requiring complex modifications to the training algorithm itself.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentEP4080414B1Systems and methods for identifying manufacturing defects
Publication Date: 2025.12.10 SAMSUNG DISPLAY CO LTD
  • EP4080414B1 patent drawingFigure 1
  • EP4080414B1 patent drawingFigure 2
  • EP4080414B1 patent drawingFigure 3

AI summary

Systems and method for classifying manufacturing defects are disclosed. A first machine learning model is trained with a training dataset, and a data sample that satisfies a criterion is identified from the training dataset. A second machine learning model is trained to learn features of the data sample. When an input dataset that includes first and second product data is received, the second machine learning model is invoked for predicting confidence of the first and second product data based on the learned features of the data sample. In response to predicting the confidence of the first and second product data, the first product data is removed from the dataset, and the first machine learning model is invoked for generating a classification based the second product data.