Defect Detection Model Using Normalized Loss Functions

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Solution Overview

Problem

Semi-supervised defect detection methods in industrial manufacturing, such as those using generative adversarial networks, suffer from low accuracy and high false positive rates, making them impractical for certain detection targets.

Innovation Solution

A defect detecting apparatus and method that utilizes a generative adversarial network trained with normalized loss functions and a multi-stage adjustment mechanism, including adjusting loss functions, anomaly score calculation, and color space conversion, to improve accuracy and stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If semi-supervised defect detection using generative adversarial networks is applied, then the need for large numbers of anomaly samples is reduced, but the detection accuracy decreases and false positive rate increases

Engineering Contradiction:
Improveease of data collectionVSAvoiddetection accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent applies preliminary action by performing data augmentation and normalization preprocessing on normal samples before training the generative adversarial network. This includes adjusting the distribution of training data, normalizing color spaces, and pre-processing images to ensure consistent input quality, which improves detection accuracy while maintaining the semi-supervised approach that requires minimal anomaly samples.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent employs parameter changes by modifying the loss function parameters and training hyperparameters of the generative adversarial network. Specifically, it adjusts the weighting parameters in the composite loss function (combining reconstruction loss, adversarial loss, and normalization loss) and optimizes learning rates and batch sizes to balance training stability with detection precision, thereby resolving the accuracy issue while keeping data collection requirements low.

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If conventional defect detection models are trained without multi-stage adjustment, then the training process is simpler, but the training speed is slower and stability is poorer

Engineering Contradiction:
Improvemodel training complexityVSAvoidtraining speed
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The patent applies segmentation by dividing the training process into multiple stages with different objectives and hyperparameters. The first stage focuses on basic reconstruction capability, the second stage introduces adversarial training, and the third stage applies normalization constraints. This staged approach accelerates convergence and improves stability compared to single-stage training, while the modular structure keeps the overall complexity manageable.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamics by making the training process adaptive through dynamic hyperparameter adjustment across stages. Learning rates, loss function weights, and batch sizes are dynamically modified based on training progress and performance metrics. This dynamic adjustment optimizes training speed and stability without requiring overly complex fixed architectures.

Inventive Principle:
Principle #15Dynamics

3Device complexity

If the loss function is not normalized during training, then the calculation is simpler, but the training stability decreases and convergence is slower

Engineering Contradiction:
Improvecalculation complexityVSAvoidtraining stability
Core Design Contradiction:
Device complexityVSStability of the object's composition

Solution Approach 1:

The patent applies parameter changes by introducing normalization parameters to standardize the loss function outputs. Specifically, it uses L2 normalization to constrain the magnitude of feature vectors and loss values, and applies softmax normalization to probability distributions. These parameter-based normalization techniques stabilize training convergence while adding minimal computational overhead compared to unnormalized approaches.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20230394651A1Defect detecting apparatus and method
Publication Date: 2023.12.07 HON HAI PRECISION INDUSTRY CO LTD
  • US20230394651A1 patent drawing
  • US20230394651A1 patent drawing

AI summary

A defect detecting apparatus and method are provided. The defect detecting apparatus receives an image to be tested. The defect detecting apparatus detects the image to be tested through a defect detecting model to generate an anomaly score corresponding to the image to be tested, and the defect detecting model is generated based on the training of a generative adversarial network and a plurality of normalized loss functions. The defect detecting apparatus compares the anomaly score with an anomaly score threshold to determine whether the image to be tested is a defective image.