Defect Detection Method Using Pre-Cleaning to Resolve Dirt Misjudgment
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Solution Overview
Problem
Existing defect detection methods in product inspection often misjudge dirt on a product's surface as defects, leading to reduced accuracy in defect detection.
Innovation Solution
A defect detection method that involves obtaining two images of a product, one before and one after cleaning, to differentiate between surface dirt and actual defects, thereby improving detection accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If defect detection is performed on product surface images, then defect detection capability is provided, but dirt on the surface is misjudged as defects, reducing detection accuracy
Solution Approach 1:
The patent applies preliminary action by cleaning the product surface before performing defect detection. The cleaning step is executed in advance to remove dirt and contaminants that would otherwise be misidentified as defects during the subsequent detection process, thereby improving measurement precision without compromising defect detection capability.
2Measurement precision
If product surface is cleaned before detection, then detection accuracy is improved, but detection process time increases
Solution Approach 1:
The patent applies partial action by performing cleaning only on the specific detection surface area rather than the entire product. This selective cleaning approach removes contaminants from the detection zone sufficient to improve accuracy, while minimizing the time and resources required compared to complete product cleaning.
Data Source
AI summary
The present application provides a defect detection method. The method includes obtaining a first image of a product and a first defect detection result of the first image. The product is cleaned, and a second image of the product is obtained after the product has been cleaned. Once a second defect detection result of the second image is obtained, a third defect detection result of the product is determined based on the first defect detection result and the second defect detection result.