Automated Defect Estimation for Tunnel Structure Inspection
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Solution Overview
Problem
Existing methods for inspecting and documenting defects in structures, such as tunnels, are inefficient and prone to errors, particularly in estimating defect points over time, as they require manual documentation and separate processing of defect charts and photographs.
Innovation Solution
An information processing apparatus and method that estimates defect locations at a second time based on captured images, generating a display image combining drawn and estimated defect images to facilitate accurate and efficient defect point estimation and documentation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual documentation and separate processing of defect charts and photographs are used, then detailed defect records can be created, but the process is inefficient and prone to errors
Solution Approach 1:
The patent combines separate defect documentation processes (manual chart drawing, photograph attachment, and data entry) into an integrated automated system. The image processing apparatus automatically generates defect charts and associates them with photographs, eliminating manual separate processing while maintaining documentation accuracy and significantly improving efficiency.
Solution Approach 2:
The patent replaces manual mechanical documentation processes with automated image processing and pattern recognition systems. Instead of inspectors manually drawing defect charts and entering data, the system automatically analyzes captured images, identifies defects, generates charts, and documents results, reducing human error and increasing productivity.
2Measurement precision
If manual defect estimation is performed, then detailed analysis can be conducted, but time consumption increases
Solution Approach 1:
The patent replaces manual defect estimation with automated image processing algorithms that analyze captured images to precisely locate and characterize defects. The system automatically measures defect positions, sizes, and characteristics, providing precise measurements comparable to manual methods but executed in minutes rather than hours.
Solution Approach 2:
The patent performs preliminary automated analysis of defect patterns and characteristics from captured images before final documentation. The system pre-identifies defect locations and characteristics, allowing rapid generation of accurate defect estimates that would otherwise require time-consuming manual measurement and analysis.
3Loss of information
If separate processing of defect charts and photographs is used, then comprehensive documentation can be achieved, but complexity of the process increases
Solution Approach 1:
The patent merges separate defect chart generation and photograph management processes into a single integrated automated workflow. The system simultaneously processes images to generate defect charts and associate relevant photographs, ensuring complete defect information documentation while simplifying the overall process complexity through automation.
Solution Approach 2:
The patent creates a multi-functional image processing system that performs multiple tasks (defect detection, chart generation, photograph association, and documentation) through a single integrated apparatus. This universal system handles all aspects of defect documentation, reducing process complexity while maintaining comprehensive information recording.
Data Source
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AI summary
An information processing apparatus includes estimation means (36, 56) for estimating a second defect location in a structure at a second time, based on a second captured image of the structure at the second time later than a first time. The information processing apparatus includes generation means (37, 57) for generating a display image including a first drawn defect image and an estimated defect image, the first drawn defect image being a drawn image indicating a first defect location in the structure at the first time, the estimated defect image indicating the second defect location estimated by the estimation means (36, 56).