Defect Image Generation for Deep Learning Training Data

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Solution Overview

Problem

Existing methods for generating training data for artificial intelligence algorithms to detect defects in products are limited in creating diverse defect images, leading to insufficient training and reduced accuracy in defect detection.

Innovation Solution

A method and system for generating defect images for training, which involves extracting a defect area from a sample image, transforming its shape, correcting it to match the target area, and synthesizing it with a base image to create diverse defect images.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If common image augmentation methods (rotating, flipping, rescaling) are used to generate training data, then the generation process is simple and fast, but the diversity of defect images is limited and insufficient for充分 training

Engineering Contradiction:
Improvetraining data generation speedVSAvoiddefect image diversity
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The patent segments the image processing into distinct components: defect area extraction from sample images, separate shape transformation operations, and synthesis with base images. This segmentation allows each component to be optimized independently, enabling both speed and diversity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces shape transformation as an additional dimension beyond traditional geometric augmentations. By transforming the shape of extracted defect areas while preserving their semantic content, the method creates fundamentally new defect patterns that differ from simple rotations or flips, significantly expanding defect image diversity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If diverse defect images are generated through complex processing, then training data quality improves, but the generation time and computational complexity increase

Engineering Contradiction:
Improvedefect image qualityVSAvoidimage generation time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary extraction of defect areas from sample images before synthesis. By pre-processing and storing defect areas separately, the actual synthesis process becomes faster as it only requires combining pre-extracted defect regions with base images, rather than performing complex processing during synthesis.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent copies extracted defect areas and applies shape transformations to create variations. This copying approach allows rapid generation of multiple defect instances from a single extracted defect region, maintaining high quality while reducing the need for extensive manual processing of each individual defect image.

Inventive Principle:
Principle #26Copying

3Ease of operation

If simple transformations are applied to defect images, then the processing is fast and simple, but the artificial intelligence algorithm cannot be sufficiently trained to detect various types and shapes of defects

Engineering Contradiction:
Improveprocessing simplicityVSAvoiddefect detection accuracy
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent introduces dynamic shape transformation that can adaptively modify defect shapes while maintaining processing efficiency. The shape transformation operations can be applied with varying degrees and types of transformation, allowing the system to generate diverse defect patterns without requiring complex manual intervention for each transformation type.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12229932B2Defect image generation method for deep learning and system therefor
Publication Date: 2025.02.18 DOOSAN HEAVY IND & CONSTR CO LTD
  • US12229932B2 patent drawing
  • US12229932B2 patent drawing
  • US12229932B2 patent drawing

AI summary

A method of generating a defect image for deep learning and a system therefor are provided. The method and the system are intended to be used in generating training data for an artificial intelligence algorithm. More specifically, the training data are defect images required to train an algorithm that identifies a defect from a product.