Defect Inspection Device With Segmented Display Control
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Solution Overview
Problem
Existing defect inspection methods rely heavily on human interpretation of images, which can be time-consuming and prone to errors, especially for less experienced inspectors, and often benefit from auxiliary indications but can be overwhelmed by excessive visual cues, leading to inaccurate and slow interpretation.
Innovation Solution
A defect inspection device and method that includes an image acquisition unit, image processing unit, storage unit, defect candidate classification unit, and display control unit to extract and classify defect candidates, allowing inspectors to control the display of auxiliary indications, thereby facilitating accurate and rapid image interpretation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If auxiliary indications are displayed to clearly indicate defect candidate images, then image interpretation accuracy is improved, but visual interference increases and interpretation speed decreases
Solution Approach 1:
The patent segments the display into multiple regions: a first display region showing the received light image and a second display region showing auxiliary indications. This spatial segmentation allows the inspector to view both the complete image context and detailed defect information without visual interference, as each region serves its specific function independently.
Solution Approach 2:
The patent introduces an intermediary structure (the classification information display unit) that mediates between the received light image and the auxiliary indications. This intermediary layer presents classified defect information in a separate, organized manner, allowing inspectors to access detailed information without the clutter of raw auxiliary indications overlapping with the image content.
2Measurement precision
If multiple auxiliary indications are shown to provide comprehensive defect information, then defect detection accuracy is improved, but device complexity increases
Solution Approach 1:
The patent applies local quality by displaying different types of information in different regions of the display device. The first display region shows the received light image with specific local characteristics, while the second display region shows auxiliary indications with different local characteristics. This allows comprehensive defect information to be presented without requiring a single complex display system, as each region is optimized for its specific function.
3Measurement precision
If auxiliary indications are superimposed on defect candidate images, then defect location is clearly indicated, but image interpretation becomes difficult
Solution Approach 1:
The patent segments the display into separate regions: the first display region for the received light image and the second display region for auxiliary indications. This segmentation allows defect location to be clearly indicated through the auxiliary indications in the second region without superimposing them on the image, thereby maintaining image interpretation ease while providing clear defect location information.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables inspectors to efficiently and accurately identify defect candidates and classify defects using controlled auxiliary indications, improving the speed and accuracy of the inspection process.
Implementation Method 1
a received light image created on the basis of reflected light or transmitted light from an inspection object which is obtained by irradiating the inspection object with light rays or radiation
Implementation Method 2
a received light image created on the basis of reflected light or transmitted light from an inspection object which is obtained by irradiating the inspection object with light rays or radiation
Data Source
AI summary
An object of the present invention is to provide a defect inspection device, a defect inspection method, and a program that support an image interpreter so that image interpretation can be performed accurately and rapidly. A defect inspection device (10) includes an image acquisition unit, an image processing unit, a storage unit (24), a defect candidate classification unit that assigns a defect classification to an extracted defect candidate image on the basis of classification information stored in the storage unit (24), a display unit (18) that displays the received light image, a manipulation unit (14) that receives selection of a display or a non-display of an auxiliary indication indicating a position of the defect candidate image and the classification of the defect candidate image on the display unit (18), and outputs a command for the selected display or non-display of the auxiliary indication, and a display control unit that performs a display or a non-display of the auxiliary indication on the display unit (18) on the basis of the command output from the manipulation unit (14).