Programmable Device Defect Mapping and Bitstream Selection
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Solution Overview
Problem
The increasing complexity and size of programmable integrated circuits (ICs) lead to higher defect rates, resulting in lower yield and increased economic costs due to the need for managing defective devices, which are often discarded or sold at reduced prices, despite having only localized impairments.
Innovation Solution
A method is developed to determine and map impaired circuitry locations within programmable devices, generating configuration bitstreams that avoid these impaired areas, allowing for the continued use of partially defective devices by programming them to utilize only functional circuitry.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If programmable ICs are manufactured according to smaller dimensions with increased complexity and die size, then functional capabilities and integration are improved, but defect rates increase and yield decreases
Solution Approach 1:
The patent segments the programmable device into multiple regions based on defect locations, creating a defect map that divides the device into functional and non-functional areas. This segmentation allows the device to be used in parts rather than discarded entirely, resolving the contradiction by maintaining reliability through selective usage while preserving adaptability through reconfiguration.
Solution Approach 2:
The patent changes the operational parameters of the programmable device by reconfiguring it to use only functional regions. By modifying the configuration bitstream to exclude defective areas, the device maintains its functional capabilities while adapting to the reduced operational area, thus resolving the yield-defect rate contradiction.
2Reliability
If defective programmable devices are discarded to maintain product quality, then system reliability is improved, but manufacturing yield and economic efficiency deteriorate
Solution Approach 1:
The patent converts the harm of defective devices into benefit by identifying and utilizing the functional portions of devices with localized defects. Instead of discarding defective devices, the system creates a defect map and reconfigures the device to operate in functional regions only, thus turning potential waste into usable products and improving manufacturing yield while maintaining quality.
Solution Approach 2:
The patent recovers value from defective devices by discarding only the defective portions (as indicated in the defect map) and recovering the functional portions for continued use. This selective discarding and recovery approach maximizes the usable output from each device, improving yield without compromising product quality.
3Reliability
If defective devices are sorted and managed separately by defect location, then device functionality is preserved, but management complexity and costs increase
Solution Approach 1:
The patent creates a universal defect map format and reconfiguration process that can handle any defect location within the programmable device. Rather than requiring separate management systems for different defect types, the same defect mapping and reconfiguration methodology applies universally, reducing management complexity while preserving device functionality in functional regions.
Data Source
AI summary
A method of enabling the use of a programmable device having impaired circuitry includes determining one or more locations of the impaired circuitry of the programmable device; generating a defect map for the programmable device based on the determined locations of the impaired circuitry; generating a plurality of configuration bitstreams to implement a circuit in the programmable device; selecting one of the plurality of configuration bitstreams that does not use the impaired circuitry indicated by the defect map; and programming the programmable device with the selected configuration bitstream.