Defect Position Determination via Image Analysis
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Solution Overview
Problem
Current methods for determining defect positions in painted products, such as automobiles, are inaccurate and labor-intensive, especially when conducted by dealers who lack fixed inspection setups, making it difficult to analyze defect trends and improve manufacturing processes.
Innovation Solution
A defect position determination system that includes a terminal device and server device, utilizing a first imaging unit to generate images, a guide display unit to determine object orientation, a second imaging unit to superimpose a marker on defects, and a defect position determination unit to calculate defect positions based on image analysis, reducing manual effort and improving accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual defect inspection is conducted by dealers, then defect information can be collected, but the determination is inaccurate and labor-intensive
Solution Approach 1:
The patent replaces manual mechanical inspection with an automated image processing system. The terminal device captures defect images, and the server device automatically determines defect positions using image analysis algorithms, eliminating the need for manual measurement and calculation while improving accuracy.
Solution Approach 2:
The patent creates a virtual model of the actual object by generating an illustration that represents the photographed object. This illustration serves as a copy that can be analyzed computationally to determine defect positions, allowing accurate measurement without physical manual inspection.
2Loss of information
If manual defect inspection is conducted by dealers, then defect information can be collected, but the process requires significant manual labor
Solution Approach 1:
The system enables self-service defect inspection where the terminal device automatically captures images and the server device automatically processes them. The dealer simply needs to photograph defects, and the system handles all subsequent analysis automatically, making the operation simple while collecting complete defect information.
Solution Approach 2:
The patent replaces complex manual inspection operations with automated image processing. The server device's defect position determination unit automatically analyzes images and calculates positions, substituting manual labor with computational processes that are both simpler to operate and more complete in information collection.
3Measurement precision
If a surface inspection device is introduced to individual dealers, then accurate defect position data can be obtained, but the device complexity and cost increase
Solution Approach 1:
The patent divides the inspection system into two segments: a simple terminal device for image capture at the dealer location, and a centralized server device for complex image processing. This segmentation allows accurate measurement without requiring complex equipment at every dealer location, reducing overall system complexity while maintaining precision.
Solution Approach 2:
The patent introduces an illustration as an intermediary between the captured image and the defect position determination. The illustration represents the photographed object and serves as a medium for computational analysis, enabling accurate measurement without direct complex physical measurement equipment at the dealer site.
4Adaptability or versatility
If images are taken at variable positions and angles by dealers, then defect information can be collected, but accurate defect position determination becomes difficult
Solution Approach 1:
The patent employs dynamic image processing that can handle images taken from various positions and angles. The server device's defect position determination unit adapts to different imaging conditions by analyzing the relationship between the captured image and the illustration, maintaining measurement precision despite the flexibility in how images are taken.
Data Source
AI summary
A first imaging unit 71 generates a first image a first image by taking an object to be inspected. A guide display unit 72 determines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unit 73 generates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unit 74 determines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unit 75 collects defect information associated with a type of the object to be inspected and the position of the defect.