Defect Stencil for AFP In Situ Inspection Calibration

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Solution Overview

Problem

Automated Fiber Placement (AFP) systems face challenges in creating predictable and accurate artificial defects for calibrating in situ inspection systems, as current methods either rely on out-of-process or post-process inspections or create unpredictable defects.

Innovation Solution

The method involves using a defect stencil to create artificial gap and overlap defects with known sizes and geometries during the layup process, allowing for precise calibration of in situ inspection systems by simulating real defects that are indistinguishable from actual ones.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If current calibration methods are used (out-of-process or post-process inspection), then inspection coverage is maintained, but manufacturing precision and reliability of calibration are deteriorated due to inability to create predictable artificial defects during active AFP process

Engineering Contradiction:
Improvedefect creation precisionVSAvoidcalibration system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

A defect stencil serves as an intermediary tool that enables precise creation of artificial defects during the active AFP process. The stencil acts as a mediator between the AFP system and the inspection system, providing known defect geometries without requiring complex calibration equipment or post-process analysis.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The defect stencil allows preliminary creation of artificial defects before inspection occurs. By pre-defining defect locations and geometries using the stencil during layup, the system enables subsequent inspection systems to be calibrated against known defects, improving both precision and reliability.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If unpredictable defects are created and identified post layup, then calibration data can be obtained, but measurement precision and reliability are worsened due to inability to know true defect characteristics

Engineering Contradiction:
Improvedefect detection precisionVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The defect stencil enables the system to self-calibrate by providing known defect characteristics directly during the layup process. The stencil itself serves as the reference standard, eliminating the need for separate calibration procedures or post-layup defect analysis, thereby reducing calibration time while maintaining high measurement precision.

Inventive Principle:
Principle #25Self-service

3Productivity

If manual inspection methods are used, then labor intensity is high, but manufacturing precision is maintained through careful manual examination

Engineering Contradiction:
Improveinspection throughputVSAvoiddefect detection accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The defect stencil creates precise copies of known defect geometries during the layup process. By stamping or imprinting standardized defect patterns onto the composite material, the system generates repeatable artificial defects that enable automated inspection systems to be calibrated efficiently, increasing productivity without sacrificing detection accuracy.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS11685129B2Method and devices to construct artificial inline defects to calibrate inspection hardware on automated fiber placement systems
Publication Date: 2023.06.27 UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR NAT AERONAUTICS & SPACE ADMINISTRATION
  • US11685129B2 patent drawing
  • US11685129B2 patent drawing
  • US11685129B2 patent drawing

AI summary

Systems, methods, and devices are provided for the creation of predictable and accurate defects in a fiber tow of an Automated Fiber Placement (AFP) process, with such artificial defects being useful to support calibration of an in situ inspection system used in the AFP process. Various embodiments include methods for creating such artificial defects that support calibration of an in situ inspection system of an AFP system or process. Various embodiments may also include a defect stencils for an AFP system or process.