Defective Data Extraction in Machine Learning Training Sets
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Solution Overview
Problem
Machine learning models face inefficiencies in classifying input data due to the presence of unsuitable and defective data, such as outlier and overlap data, which can hinder proper learning and verification processes.
Innovation Solution
A method utilizing a vector neural network with multiple vector neuron layers to extract defective data by calculating feature spectra, determining degrees of similarity, and applying a defectiveness function to identify and remove outlier and overlap data based on threshold comparisons.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If training data includes all available data without filtering, then the quantity of training data is maximized, but the reliability of machine learning model deteriorates due to presence of defective data
Solution Approach 1:
The patent extracts defective data (outliers and overlap data) from the training dataset by calculating defectiveness indices based on feature spectrum similarities. This extraction process removes harmful elements while preserving the overall dataset quantity, thereby maintaining training data volume while improving model reliability through selective elimination of defective samples.
2Reliability
If defective data is removed from training data, then the reliability of machine learning model is improved, but the quantity of training data decreases
Solution Approach 1:
The patent changes the parameter of data quality by introducing a defectiveness index calculation that evaluates each training sample based on feature spectrum similarity. By adjusting the threshold for defectiveness determination, the system can control the balance between removing defective data and preserving sufficient training data quantity, thereby improving reliability without excessive data loss.
3Measurement precision
If manual inspection of training data is performed to identify defective data, then the measurement precision of defective data detection is improved, but the productivity of data preparation process deteriorates
Solution Approach 1:
The patent replaces manual inspection with an automated computational system that calculates feature spectra and defectiveness indices using a trained machine learning model. This substitution of mechanical/manual processes with automated computational methods maintains high detection precision while dramatically improving productivity by enabling batch processing of large datasets without human intervention.
Solution Approach 2:
The system performs self-service by automatically identifying and flagging defective data through the defectiveness index calculation mechanism. The machine learning model autonomously evaluates each training sample's feature spectrum similarity and determines defectiveness without requiring external manual review, thereby maintaining precision while enhancing processing efficiency and productivity.
4Measurement precision
If feature spectrum calculation is performed for all training data, then the measurement precision of defective data identification is improved, but the use of energy and computational resources deteriorates
Solution Approach 1:
The patent applies partial action by calculating defectiveness indices selectively rather than uniformly processing all training data with equal depth. The system uses the trained machine learning model to identify and focus computational resources on samples with higher probabilities of being defective, thereby maintaining identification precision while reducing overall computational energy consumption through targeted analysis.
Data Source
AI summary
A method according to the present disclosure includes (b1) selecting a reference class from a plurality of classes, (b2) calculating a plurality of degrees of similarity between a feature spectrum corresponding to target training data and a plurality of the feature spectra belonging to the reference class, (b3) applying, to the plurality of degrees of similarity, a defectiveness function that is determined in advance, and calculating a defectiveness index with respect to the target training data, and (b4) determining whether the target training data is the defective data, based on a result of comparison between the defectiveness index and a threshold value.


