Defective Pixel Detection via Integrated Image Processing
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Solution Overview
Problem
Existing optronic systems face challenges in detecting defective pixels, particularly temporary faults that occur randomly, leading to increased manufacturing costs and complexity due to redundant procedures in defective pixel detection and image processing modules.
Innovation Solution
A method that integrates a combined pixel processing and defective pixel detection procedure within the image processing module, reusing results from pixel processing to detect defective pixels and determine the reliability of output data, thereby reducing computational costs and implementing redundant procedures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a separate defective pixel detection module is integrated into the optronic system, then defective pixels can be detected, but manufacturing costs and device complexity increase
Solution Approach 1:
The patent merges the defective pixel detection module with the image processing module, allowing a single module to perform both image processing and defective pixel detection functions. This integration eliminates the need for separate dedicated detection hardware, thereby reducing device complexity and manufacturing costs while maintaining reliable defective pixel detection capability through the combined analysis of image data and pixel behavior patterns.
Solution Approach 2:
The image processing module is designed to perform multiple functions: standard image processing tasks and defective pixel detection. By making the module universal, the system avoids adding specialized single-function components, thus reducing overall system complexity while achieving comprehensive image quality assurance through integrated processing and detection capabilities.
2Reliability
If a separate defective pixel detection module is implemented, then defective pixels can be detected, but manufacturing costs increase
Solution Approach 1:
The patent combines defective pixel detection functionality with the existing image processing module, eliminating the need to manufacture and integrate separate detection hardware. This merger reduces component count, simplifies assembly processes, and lowers manufacturing costs while maintaining effective defective pixel detection through integrated analysis of image data and pixel response patterns.
Solution Approach 2:
The image processing module is enhanced to perform multiple functions including both standard image processing and defective pixel detection. This multi-functional approach eliminates the need for additional dedicated detection components, thereby reducing manufacturing complexity and cost while achieving reliable quality control through the universal module's comprehensive processing capabilities.
3Adaptability or versatility
If redundant procedures are implemented in both defective pixel detection module and image processing module, then each module can function independently, but computational cost increases
Solution Approach 1:
The patent merges the defective pixel detection module with the image processing module into a single integrated unit. This combination eliminates redundant computational procedures by allowing the unified module to perform both image processing and defective pixel detection using shared computational resources and data flows, thereby reducing overall computational cost and energy consumption while maintaining functional versatility.
Solution Approach 2:
The integrated module is designed with universal capabilities to handle both image processing and defective pixel detection functions. This multi-functionality allows the module to efficiently manage diverse tasks using a single set of computational resources, eliminating the need for separate independent processing chains and significantly reducing redundant computations and energy usage.
Data Source
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AI summary
The invention relates to a method for detecting defective pixels as part of an image-processing procedure including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying (1111) the pixel-processing procedure; analysing (1112) a result of the pixel-processing procedure; in the event that a singular result is obtained representing a defect on a photosite of the image sensor that supplied said pixel, incrementing (1113) a number of detections of a singular result for said pixel; and associating (1115) said pixel with a classification value representing a defective pixel when said number reaches a first threshold (1114).