Deflection Amplifier Settling Time Inspection via Beam Current

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Solution Overview

Problem

Current methods for determining the optimal settling time of a deflection amplifier in electron beam writing apparatuses are time-consuming and lack efficient methods for quickly judging settling performance deterioration or amplifier failure, leading to reduced throughput and increased downtime.

Innovation Solution

A method involving setting a settling time, shooting multiple patterns alternately through first and second apertures, measuring beam currents, calculating integral currents, and comparing these to reference values to determine optimal settling time and detect amplifier failure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the settling time is set long, then the pattern dimension precision is improved, but the throughput is reduced

Engineering Contradiction:
Improvepattern dimension precisionVSAvoidthroughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent applies preliminary action by pre-measuring the settling characteristics of the deflection amplifier during the inspection phase. The settling time is determined in advance through automated beam current measurements and integral current calculations, rather than determining it through time-consuming iterative writing and measurement cycles. This allows the optimal settling time to be established beforehand, ensuring pattern precision while enabling faster throughput in subsequent production operations.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If the settling time is set short, then the throughput is improved, but the pattern dimension precision deteriorates

Engineering Contradiction:
ImprovethroughputVSAvoidpattern dimension precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent implements feedback by continuously monitoring the beam current and calculating the integral current during the settling period. The measured integral current is compared against reference values to automatically determine whether the settling time is sufficient for achieving the required pattern precision. This feedback mechanism enables dynamic optimization of the settling time, allowing the system to use the shortest possible settling time that still ensures adequate pattern dimension precision, thereby maximizing throughput.

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If conventional inspection methods are used, then the settling time optimization is achieved, but the inspection time is excessively long

Engineering Contradiction:
Improvesettling time optimizationVSAvoidinspection time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent replaces the conventional mechanical inspection process (writing patterns on substrates, developing, etching, and physical measurement) with an automated electrical measurement system. By substituting the mechanical/chemical inspection chain with direct beam current measurements and integral current calculations, the system achieves settling time optimization without the time-consuming manual operations, reducing inspection time from approximately ten hours to a fraction of that time.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Reliability

If detailed pattern writing and measurement are performed, then the settling performance is accurately evaluated, but the downtime increases

Engineering Contradiction:
Improvesettling performance evaluation accuracyVSAvoiddowntime
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent extracts the essential measurement function from the complete pattern writing and evaluation process. Instead of performing full pattern writing, development, and measurement cycles, the invention extracts only the critical beam current measurement and integral current calculation steps that directly indicate settling performance. This extraction maintains adequate evaluation accuracy while dramatically reducing the time required, minimizing downtime for inspection and amplifier replacement decisions.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces the time required to find the optimal settling time and quickly identifies amplifier failures, thereby enhancing operational efficiency and minimizing downtime.

Implementation Method 1

a deflection amplifier is used for such a beam deflection... deflecting the charged particle beam by a deflector controlled by an output of a deflection amplifier

Methodology Applied
Scientific EffectElectromagnetic deflection: Lorentz Force

Implementation Method 2

measuring beam currents of the shooting, calculating an integral current of the beam currents measured

Methodology Applied
Scientific EffectBeam current measurement: Electrical Resistance

Data Source

PatentUS7989777B2Method for inspecting settling time of deflection amplifier, and method for judging failure of deflection amplifier
Publication Date: 2011.08.02 NUFLARE TECH INC
  • US7989777B2 patent drawing
  • US7989777B2 patent drawing
  • US7989777B2 patent drawing

AI summary

A method for inspecting a settling time of a deflection amplifier includes setting a settling time, performing shooting a plurality of times alternately to project two patterns of different types which are shaped by making a charged particle beam pass through a first and a second apertures while deflecting the charged particle beam by a deflector controlled by an output of a deflection amplifier which is driven based on the settling time having been set, measuring beam currents of the shooting, calculating an integral current of the beam currents measured, and calculating a difference between the integral current calculated and a reference integral current to output the difference.