Deflection Structure Plates for X-ray Phase-Contrast Imaging

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Solution Overview

Problem

Differential phase-contrast imaging techniques face low dose efficiency due to the absorption of 50% of X-ray radiation by analyzer gratings, which limits the amount of radiation available for image detection in medical imaging applications.

Innovation Solution

A deflection device with a periodic structure that functions as a micro-lens, reducing the duty cycle of the absorption device and allowing more X-ray radiation to reach the detector, is integrated into the X-ray imaging system, along with an absorption device that reduces X-ray opaque areas, enhancing dose efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If an analyzer grating is used to probe the fringe pattern in differential phase-contrast imaging, then phase contrast information can be obtained, but 50% of the X-ray radiation is absorbed and only half contributes to the image signal

Engineering Contradiction:
Improvephase contrast informationVSAvoidX-ray radiation absorption
Core Design Contradiction:
Measurement precisionVSLoss of energy

Solution Approach 1:

The patent extracts only the necessary portion of the fringe pattern information by using a deflection structure that creates a smaller effective absorption area. Instead of requiring 50% absorption to probe the fringe pattern, the invention uses a deflection structure with smaller duty cycle (e.g., 25% or less) that still provides sufficient phase contrast information through the generated fringe pattern, thereby reducing X-ray absorption loss

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the key parameter of the analyzer grating from traditional 50% duty cycle to a deflection structure with smaller duty cycle (25% or less). By modifying the structural parameters of the deflection structure (changing the ratio of absorbing to transparent areas), the system achieves reduced radiation absorption while maintaining the ability to probe fringe patterns for phase contrast imaging

Inventive Principle:
Principle #35Parameter changes

2Productivity

If the duty cycle of the absorption device is reduced to improve dose efficiency, then more X-ray radiation reaches the detector, but the ability to probe the fringe pattern may be compromised

Engineering Contradiction:
Improvedose efficiencyVSAvoidfringe pattern probing capability
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent introduces a deflection structure as an intermediary element between the phase grating and the detector. This deflection structure serves as a mediator that transforms the phase information into a detectable fringe pattern with reduced absorption requirements. The deflection structure acts as an intermediate that enables fringe pattern generation with smaller duty cycle, bridging the gap between dose efficiency and measurement precision

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the traditional mechanical absorption grating system with a deflection structure that utilizes phase modulation and diffraction effects. Instead of relying on mechanical absorption to probe fringes, the system uses a deflection structure that creates fringe patterns through phase manipulation, allowing reduced absorption while maintaining probing capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly reduces X-ray absorption, enabling more than 50% of the transmitted radiation to contribute to the image signal, thereby improving dose efficiency without compromising phase sensitivity, making it suitable for medical imaging applications.

Implementation Method 1

The first areas are provided to change the phase and/or amplitude of an X-ray radiation

Methodology Applied
Scientific EffectPhase modulation: Phase Modulation

Implementation Method 2

The deflection structure comprises a first plurality of first areas and a second plurality of second areas... the first areas are provided to change the phase and/or amplitude of an X-ray radiation

Methodology Applied
Scientific EffectX-ray refraction: Refraction

Implementation Method 3

The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that... every period of the deflection structure is adapted to function as a micro-lens structure focussing X-ray radiation

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS10734128B2Differential phase-contrast imaging with focussing deflection structure plates
Publication Date: 2020.08.04 KONINKLIJKE PHILIPS NV
  • US10734128B2 patent drawing
  • US10734128B2 patent drawing
  • US10734128B2 patent drawing

AI summary

The present invention relates to X-ray differential phase-contrast imaging, in particular to a deflection device for X-ray differential phase-contrast imaging. In order to provide differential phase-contrast imaging with improved dose efficiency, a deflection device (28) for X-ray differential phase-contrast imaging is provided, comprising a deflection structure (41) with a first plurality (44) of first areas (46), and a second plurality (48) of second areas (50). The first areas are provided to change the phase and/or amplitude of an X-ray radiation; and wherein the second areas are X-ray transparent. The first and second areas are arranged periodically such that, in the cross section, the deflection structure is provided with a profile arranged such that the second areas are provided in form of groove-like recesses (54) formed between first areas provided as projections (56). The adjacent projections form respective side surfaces (58) partly enclosing the respective recess arranged in between. The side surfaces of each recess have a varying distance (60) across the depth (62) of the recess.