Deformable Probe for Non-Contact Voltage Measurement

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Solution Overview

Problem

Conventional non-contact voltage measuring devices face accuracy issues when measuring voltages on conductors with varying diameters due to the probe's inability to maintain a consistent capacitance value with the electric field shield, leading to variations in parasitic capacitance and reduced measurement accuracy.

Innovation Solution

A non-contact voltage measuring device with a deformable probe that maintains a constant parasitic capacitance value with the electric field shield, allowing for accurate measurement of voltages on conductors with different diameters by using a deformable electrode and an electric field shield configuration that shields the electric circuit from external electric fields.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the probe is made deformable to adapt to different conductor shapes, then the adaptability improves, but the parasitic capacitance between the probe and electric field shield varies, worsening measurement precision

Engineering Contradiction:
Improveadaptability to different conductor shapesVSAvoidmeasurement precision of voltage
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The probe is divided into multiple segments that can independently deform. Each segment can adapt to different conductor shapes while the overall probe structure maintains a consistent electrical relationship with the electric field shield, preventing parasitic capacitance variation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The probe incorporates dynamic elements that allow it to change shape in response to different conductor geometries. The probe structure includes flexible or movable components that enable adaptation while maintaining stable electrical characteristics through controlled deformation mechanisms.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If the probe is brought closer to the conductor to increase coupling capacitance, then measurement precision improves, but the probe may contact the conductor, causing safety issues and measurement errors

Engineering Contradiction:
Improvemeasurement precision of voltageVSAvoidreliability of non-contact measurement
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The probe tip is designed with a curved or spherical surface that naturally follows the contour of the conductor. This curved geometry allows the probe to maintain a consistent minimal distance from the conductor surface, maximizing coupling capacitance while preventing contact through the conformal shape adaptation.

Inventive Principle:
Principle #14Spheroidality (Curvature)

3Device complexity

If a fixed probe structure is used, then device complexity is reduced, but the probe cannot adapt to conductors with different diameters, worsening measurement precision

Engineering Contradiction:
Improvestructural simplicity of probeVSAvoidmeasurement precision on various diameter conductors
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The probe incorporates flexible materials or thin-film structures that can elastically deform to match different conductor diameters. This flexible construction allows the probe to adapt its shape passively through material properties rather than complex mechanical mechanisms, maintaining relative structural simplicity while achieving adaptability.

Inventive Principle:
Principle #30Flexible shells and thin films

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables precise measurement of voltages on conductors with varying diameters by maintaining a consistent parasitic capacitance value, thereby improving measurement accuracy and reducing errors caused by probe deformation.

Implementation Method 1

an electric field shield which covers at least part of the electric circuit so as to shield the electric circuit from an electric field incident on the electric circuit

Methodology Applied
Scientific EffectElectric field shielding: Faraday Cage

Implementation Method 2

a coupling capacitance is formed between the electrode of the probe and the conductor

Methodology Applied
Scientific EffectCapacitance coupling: Capacitance

Implementation Method 3

the probe causing a capacitance value of a parasitic capacitance formed between an electrode of the probe and the electric field shield to be maintained at a given level

Methodology Applied
Scientific EffectParasitic capacitance: Parasitic Capacitance

Data Source

PatentEP3118632B1Non-contact voltage measurement device
Publication Date: 2020.07.08 OMRON CORP
  • EP3118632B1 patent drawingFigure 1
  • EP3118632B1 patent drawingFigure 2
  • EP3118632B1 patent drawingFigure 3

AI summary

Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode (11A) which is deformable depending on a shape of a wire "w" is electrically connected, via a connecting section (20), to an outer electrode (11B) fixed to an electric field shield (12).